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The Proposed Doppler Electron Velocimeter and the Need for Nanoscale Dynamics

Published online by Cambridge University Press:  14 March 2018

Phillip L. Reu
Phillip L. Reu*
Affiliation:
Sandia National Laboratories,†Albuquerque, NM
*
plreu@sandia.gov

Extract

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As engineering challenges grow in the ever-shrinking world of nano-design, methods of making dynamic measurements of nano-materials and systems become more important. The Doppler electron velocimeter (DEV) is a new measurement concept motivated by the increasing importance of nano-dynamics. Nano-dynamics is defined in this context as any phenomenon that causes a dynamically changing phase in an electron beam, and includes traditional mechanical motion, as well as additional phenomena including changing magnetic and electric fields. The DEV is only a theoretical device at this point. This article highlights the importance of pursuing nano-dynamics and presents a case that the electron microscope and its associated optics are a viable test bed to develop this new measurement tool.

Type
Research Article
Information
Microscopy Today , Volume 15 , Issue 3 , May 2007 , pp. 18 - 23
Copyright
Copyright © Microscopy Society of America 2007

Footnotes

†

Sandia is a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States Department of Energy's National Nuclear Security Administration under Contract DE-AC04-94AL85000.

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