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Putting a Sphere on an Atomic Force Microscope Cantilever Tip

Published online by Cambridge University Press:  14 March 2018

Stefan Zauscher
Stefan Zauscher*
Affiliation:
University of Wisconsin Madison

Extract

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Atomic Force Microscopes (AFM) can measure the force between a surface and the tip of a cantilever as a junction of separation with great precision. For example, van der Waals type forces and electrostatic repulsive forces can easily be measured in aqueous solutions using an AFM. The complex, pyramidal shape of the typical AFM cantilever is, however, not well suited for quantitative measurements. It is thus desirable to attach particles of known geometry (usually spheres) to the tip of a cantilever.

Type
Research Article
Information
Microscopy Today , Volume 5 , Issue 10 , December 1997 , pp. 6
Copyright
Copyright © Microscopy Society of America 1997

References

1. Ducker, W. A ; Senden, T. J.; Pashley, R. M. Measurement of Forces in Liquids Using A Force Microscope. Langmulr, 1992, 8, 1831-1836.Google Scholar
2. Butt, H.; Jaschke, M.; Ducker, W. A. Measuring surface forces in aqueous electrolyte solution with the atomic torce microscope, Bioelectrochemistry and Bioenergetics, 1995, 38, 191–204.Google Scholar
3. Biggs, S. Steric and Bridging Forces between Surfaces Bearing Absorbed Polymer: An Atomic Force Microscopy Study. Langmuir, 1995, 11, 156–162.Google Scholar
4. Braithwaite, G. J.C., and Luckham, P. F. Study of Attractive Interactions Between Poly(ethylene-oxide) Coated Surfaces Using AFM. In: Proceedings of the NATO Advanced Study Institute on Micro/Nanotribology and its Applications (Sesimbra, Portugal, June 16-18, 1996), Bhushan, B. ed. Kluwer Academic Publishers, Dordrecht, NL 121–127.Google Scholar
5.Digital Instruments, Attaching Particles to AFM Cantilevers. Support Note No. 226, Rev. A. Digital Instruments. 112 Robin Hill Rd.. Santa Barbara CA, 93117. 1996,Google Scholar
6.Norland Products, 695 Joyce Kilmer Ave., New Brunswick, NJ 08902, phone: 908-545-7828; website; http://www.norlandprod.com Google Scholar
7.Digital Instruments, 112 Robin Hill Rd., Santa Barbara CA, 93117, phone: 800-873-9750; website: http://www.di.com Google Scholar