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Measurements of Natural and Synthetic Diamond Samples Using Kelvin Probe, Surface Photovoltage and Ambient Pressure Photoemission Techniques

Published online by Cambridge University Press:  06 February 2017

Susanna Challinger ,
Iain Baikie  and
A. Glen Birdwell
Susanna Challinger*
Affiliation:
KP Technology Ltd, Wick, Caithness, United Kingdom.
Iain Baikie
Affiliation:
KP Technology Ltd, Wick, Caithness, United Kingdom.
A. Glen Birdwell
Affiliation:
U.S. Army Research Laboratory, Adelphi, Maryland, USA.
*
*(Email: susanna@kptechnology.ltd.uk)
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Abstract

Diamond is a promising wide band-gap semiconductor material for use in devices; therefore a thorough understanding of the surface electronic structure is important. The Kelvin Probe (KP), Surface Photovoltage / Surface Photovoltage Spectroscopy (SPV/SPS) and Ambient Pressure Photoemission Spectroscopy (APS) techniques are commonly applied to traditional and organic semiconductor materials. The application of these techniques to synthetic and natural diamond samples provides some challenges: surface charge on the samples and atypical capacitive interaction with the KP tip. In this study, measurements using a combination of KP, SPV/SPS and APS techniques are taken of samples of natural and synthetic diamond samples to investigate their surface electronic structure and compare their different properties. These techniques are all non-contact and non-destructive. The Fermi Level position of the diamond samples was found to vary, typically between 4.3 – 4.9 eV, depending on the light illumination. For example, when a natural diamond sample was illuminated with 400 nm light from a 150W Quartz Tungsten Halogen light source, there was a surface photovoltage response of ∼250 mV. The oxygen terminated synthetic diamond sample required near continuous illumination at low visible wavelengths in order to retain sufficient conductivity to allow measurement with the Kelvin Probe. By contrast, the natural diamond samples measured showed good conductivity in the layers underneath the top surface. In summary, the KP, SPV/SPS and APS measurement techniques provided some interesting information on the diamond samples and an initial investigation of their surface electronic states is performed.

Keywords

diamondphotoemissionelectronic structure
Type
Articles
Information
MRS Advances , Volume 2 , Issue 41: Electronics, Magnetics and Photonics , 2017 , pp. 2229 - 2234
Copyright
Copyright © Materials Research Society 2017 

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References

REFERENCES

Landstrass, M. I. and Ravi, K. V., Appl. Phys. Lett. 55(10), 975–977 (1989).CrossRefGoogle Scholar
May, P. W., Endeavour 19(3), 101–106 (1995).CrossRefGoogle Scholar
Aleksov, A., Kubovic, M., Kasu, M., Schmid, P., Grobe, D., Ertl, S., Schreck, M., Stritzker, B. and Kohn, E., Diam. Relat. Mat. 13(2), 233–240 (2004).CrossRefGoogle Scholar
Pomorski, M., Caylar, B. and Bergonzo, P., Appl. Phys. Lett. 103(11), 4 (2013).CrossRefGoogle Scholar
May, P. W., Regan, E. M., Taylor, A., Uney, J., Dick, A. D. and McGeehan, J., Diam. Relat. Mat. 23, 100–104 (2012).CrossRefGoogle Scholar
Takeuchi, D., Kato, H., Ri, G. S., Yamada, T., Vinod, P. R., Hwang, D., Nebel, C. E., Okushi, H. and Yamasaki, S., Appl. Phys. Lett. 86(15), 3 (2005).CrossRefGoogle Scholar
Pace, E., Di Benedetto, R. and Scuderi, S., Diam. Relat. Mat. 9 (3-6), 987–993 (2000).CrossRefGoogle Scholar
Kleshch, V. I., Purcell, S. T. and Obraztsov, A. N., Sci Rep 6, 7 (2016).CrossRefGoogle Scholar
Baikie, I. D., Grain, A. C., Sutherland, J. and Law, J., Appl. Surf. Sci. 323, 45–53 (2014).CrossRefGoogle Scholar
Harwell, J. R., Baikie, T. K., Baikie, I. D., Payne, J. L., Ni, C., Irvine, J. T. S., Turnbull, G. A. and Samuel, I. D. W., Phys. Chem. Chem. Phys. 18(29), 19738–19745 (2016).CrossRefGoogle Scholar
Spicer, W. E. and Herreragomez, A., in Proc. SPIE 2022, Photodetectors and Power Meters (October 15, 1993), Vol. 18.Google Scholar
Jelezko, F. and Wrachtrup, J., Phys. Status Solidi A 203(13), 3207–3225 (2006).CrossRefGoogle Scholar
Zheng, J. C., Xie, X. N., Wee, A. T. S. and Loh, K. P., Diam. Relat. Mat. 10 (3-7), 500–505 (2001).CrossRefGoogle Scholar
Itoh, Y., Sumikawa, Y., Umezawa, H. and Kawarada, H., Appl. Phys. Lett. 89(20), 3 (2006).CrossRefGoogle Scholar
Cui, J. B., Ristein, J. and Ley, L., Phys. Rev. Lett. 81(2), 429–432 (1998).CrossRefGoogle Scholar
Kronik, L. and Shapira, Y., Surf. Sci. Rep. 37 (1-5), 1–206 (1999).CrossRefGoogle Scholar
Rezek, B., Sauerer, C., Nebel, C. E., Stutzmann, M., Ristein, J., Ley, L., Snidero, E. and Bergonzo, P., Appl. Phys. Lett. 82(14), 2266–2268 (2003).CrossRefGoogle Scholar
Lagowski, J., Balestra, C. L. and Gatos, H. C., Surf. Sci. 27(3), 547–558 (1971).CrossRefGoogle Scholar