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Materials Analysis with High Energy Ion Beams Part I: Rutherford Backscattering

Published online by Cambridge University Press:  29 November 2013

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Abstract

This article discusses the underlying principles of Rutherford backscattering spectrometry (RBS). Consideration of the theory of the interaction of high energy ions with solids leads to the conclusion that quantitative elemental analysis of the near-surface composition of solids can be performed by RBS. Examples are given.

Type
Materials Microanalysis
Copyright
Copyright © Materials Research Society 1987

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References

1.Bethe, H.A., Ann. Phys. 5 (1930) p. 325.CrossRefGoogle Scholar
2.Bloch, F., Ann. Phys. 16 (1933) p. 285; Z. Phys. 81 (1933) p. 363.CrossRefGoogle Scholar
3.Ziegler, J.F., Helium Stopping Powers and Ranges in All Elements (Pergamon, Oxford, U.K., 1977).Google Scholar
4.Chu, W-K., Mayer, J.W., and Nicolet, M-A., Backscattering Spectrometry (Academic Press, New York, 1978).CrossRefGoogle Scholar
5.Feldman, L.C. and Mayer, J.W., Fundamentals of Surface and Thin Film Analysis (North-Holland, New York, 1986).Google Scholar
6.Johnson, D.W. Jr., Gyorgy, E.M., Rhodes, W.W., Cava, R.J., Feldman, L.C., and vanDover, R.B., Advances in Ceramic Materials, Vol. 2 (American Ceramic Society, Columbus, OH, 1987).Google Scholar
7.Kwo, J.W., Hsieh, T.C., Fleming, R.M., Hong, M., Liou, S.H., Davidson, B.A., and Feldman, L.C. (to be published).Google Scholar
8.Brasen, D., Willens, R.H., Nakahara, S., and Boone, T., J. Appl. Phys. 60 (1986) p. 3527.CrossRefGoogle Scholar
9.der Veen, J.F. van, Surf. Sci. Rep. 5/6 (1985) p. 199.CrossRefGoogle Scholar