Hostname: page-component-8448b6f56d-wq2xx Total loading time: 0 Render date: 2024-04-24T21:43:16.872Z Has data issue: false hasContentIssue false

Organic Semiconductor Devices with Enhanced Field and Environmental Responses for Novel Applications

Published online by Cambridge University Press:  31 January 2011

Get access

Abstract

We discuss some recent advances in the use of organic semiconductor devices with additional or enhanced functionality beyond simple electrical switching. These include diodes that act as local temperature sensors or that filter reverse-bias currents at tens of megahertz frequency. Transistors are described with a range of sensing and reporting functions, for such properties as pressure, magnetic field, and chemical vapor. Because these devices will likely be employed in arrays and assemblies, we also present concepts of some larger, integrated components such as artificial skin, sensor arrays, and wireless power systems. The common theme of these devices is that they build on an extensive and growing understanding of the parent transistors and diodes, but represent a departure into new physical phenomena and application areas.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Faupel, F., Dimitrakopoulos, C., Kahn, A., Woll, C., J. Mater. Res. 19, 1887 (2004).CrossRefGoogle Scholar
2.Gamota, D., Brazis, P., Kalyanasundaram, K., Printed Organic and Molecular Electronics (Kluwer Academic Publishers, Norwell, MA, 2004).CrossRefGoogle Scholar
3.Jenekhe, S., Chem. Mater. 16, 4381 (2004).Google Scholar
4.Kagan, C., Andry, P., Thin Film Transistors (Marcel Dekker, New York, 2004).Google Scholar
5.Malliaras, G., Friend, R., Phys. Today 58, 53 (2005).CrossRefGoogle Scholar
6.Sun, Y.M., Liu, Y.Q., Zhu, D.B., J. Mater. Chem. 15, 53 (2005).CrossRefGoogle Scholar
7.Zauner, K.P., Crit. Rev. Solid State Mater. Sci. 30, 33 (2005).CrossRefGoogle Scholar
8.Katz, H.E., Chem. Mater. 16, 4748 (2004).CrossRefGoogle Scholar
9.Katz, H.E., Kloc, C., Bao, Z., Zaumseil, J., Sundar, V., J. Mater. Res. 19, 1995 (2004).CrossRefGoogle Scholar
10.Facchetti, A., Yoon, M.-H., Marks, T.J., Chem. Mater. 16, 4715 (2004).CrossRefGoogle Scholar
11.Dodabalapur, A., Mater. Today 9, 24 (2006).CrossRefGoogle Scholar
12.Singh, T.B., Sariciftci, N.S., Annu. Rev. Mater. Res. 36, 199 (2006).CrossRefGoogle Scholar
13.Tang, Q.X., Li, R.J., Wang, H.F., Li, H.X., Hu, W.P., Prog. Chem. 18, 1538 (2006).Google Scholar
14.Gamota, D., Printed Organic and Molecular Electronics (Springer, New York, 2004).CrossRefGoogle Scholar
15.Bao, Z., Locklin, J., Eds., Organic Field-Effect Transistors (CRC Press, Boca Raton, FL, 2007).Google Scholar
16.Kagan, C., Andry, P., Thin-film Transistors (Marcel Dekker, Inc., New York, 2003).CrossRefGoogle Scholar
17.Holder, E., Langeveld, B.M.W., Schubert, U.S., Adv. Mater. 17, 1109 (2005).CrossRefGoogle Scholar
18.Ishibashi, T., Yamada, J., Hirano, T., Iwase, Y., Sato, Y., Nakagawa, R., Sekiya, M., Sasaoka, T., Urabe, T.Jpn. J. Appl. Phys., Part 1 45, 4392 (2006).CrossRefGoogle Scholar
19.Khan, R.U.A., Hunziker, C., Gunter, P., J. Mater. Sci.: Mater. Electron. 17, 467 (2006).Google Scholar
20.Carpi, F., De Rossi, D., Opt. Laser Technol. 38, 292 (2006).CrossRefGoogle Scholar
21.Antoniadis, H., Lui, M.W., J. Soc. Inf. Display 13, 389 (2005).CrossRefGoogle Scholar
24.So, F., Krummacher, B., Mathai, M.K., Poplavskyy, D., Choulis, S.A., Choong, V.E.. J. Appl. Phys. 102 (9), 091101 (2007).CrossRefGoogle Scholar
25.Ackermann, J., Videlot, C., El Kassmi, A., Guglielmetti, R., Fages, F., Adv. Funct. Mater. 15, 810 (2005).CrossRefGoogle Scholar
26.Chu, C.-W., Shao, Y., Shrotriya, V., Yang, Y., Appl. Phys. Lett. 86, 243506 (2005).CrossRefGoogle Scholar
27.Forrest, S.R., MRS Bull. 30 (1), 28 (2005).CrossRefGoogle Scholar
28.Hara, K., Sato, T., Katoh, R., Furube, A., Yoshihara, T., Murai, M., Kurashige, M., Ito, S., Shinpo, A., Suga, S., Arakawa, H., Adv. Funct. Mater. 15, 246 (2005).CrossRefGoogle Scholar
29.Schmidt-Mende, L., Bach, U., Humphry-Baker, R., Horiuchi, T., Miura, H., Ito, S., Uchida, S., Gratzel, M., Adv. Mater. 17, 813 (2005).CrossRefGoogle Scholar
30.Velusamy, M., Thomas, K.R.J., Lin, J.T., Hsu, Y.C., Ho, K.C., Org. Lett. 7, 1899 (2005).CrossRefGoogle Scholar
31.Yang, F., Shtein, M., Forrest, S.R., Nat. Mater. 4, 37 (2005).CrossRefGoogle Scholar
32.Yang, X.N., Loos, J., Veenstra, S.C., Verhees, W.J.H., Wienk, M.M., Kroon, J.M., Michels, M.A.J., Janssen, R.A.J., Nano Lett. 5, 579 (2005).CrossRefGoogle Scholar
33.Alam, M.M., Jenekhe, S.A., Chem. Mater. 16, 4647 (2004).CrossRefGoogle Scholar
34.Dennler, G., Sariciftci, N.S., Proc. IEEE 93, 1429 (2005).CrossRefGoogle Scholar
35.Nakamura, J., Yokoe, C., Murata, K., Takahashi, K., J. Appl. Phys. 96, 6878 (2004).CrossRefGoogle Scholar
36.Xue, J.G., Uchida, S., Rand, B.P., Forrest, S.R., Appl. Phys. Lett. 84, 3013 (2004).CrossRefGoogle Scholar
37.Yoo, S., Domercq, B., Kippelen, B., Appl. Phys. Lett. 85, 5427 (2004).CrossRefGoogle Scholar
38.Xue, J.G., Rand, B.P., Uchida, S., Forrest, S.R., J. Appl. Phys. 98 (2005).Google Scholar
39.Ma, W., Yang, C., Gong, X., Lee, K., Heeger, A.J., Adv. Funct. Mater. 15, 1617 (2005).CrossRefGoogle Scholar
40.Li, G., Shrotriya, V., Huang, J., Yao, Y., Moriarty, T., Emery, K., Yang, Y., Nat. Mater. 4, 864 (2005).CrossRefGoogle Scholar
41.Tian, H.K., Wang, J., Shi, J., Yan, D., Wang, L., Geng, Y., Wang, F., J. Mater. Chem. 15, 3026 (2005).CrossRefGoogle Scholar
42.Crouch, D.J., Skabara, P.J., Sparrowe, D., Heeney, M., McCulloch, I., Coles, S.J., Hursthouse, M.B., Chem. Commun. 1465 (2005).CrossRefGoogle Scholar
43.Li, Y.N., Wu, Y.L., Gardner, S., Ong, B.S., Adv. Mater. 17, 849 (2005).CrossRefGoogle Scholar
44.Mas-Torrent, M., Hadley, P., Bromley, S.T., Crivillers, N., Veciana, J., Rovira, C., Appl. Phys. Lett. 86, 012110 (2005).CrossRefGoogle Scholar
45.Meng, H., Sun, F., Goldfinger, M.B., Jaycox, G.D., Li, Z., Marshall, W.J., Blackman, G.S., J. Am. Chem. Soc. 127, 2406 (2005).CrossRefGoogle Scholar
46.Merlo, J.A., Newman, C.R., Gerlach, C.P., Kelley, T.W., Muyres, D.V., Fritz, S.E., Toney, M.F., Frisbie, C.D., J. Am. Chem. Soc. 127, 3997 (2005).CrossRefGoogle Scholar
47.Mori, T., Takeuchi, H., Fujikawa, H., J. Appl. Phys. 97, 066102 (2005).CrossRefGoogle Scholar
48.Payne, M.M., Parkin, S.R., Anthony, J.E., Kuo, C.C., Jackson, T.N., J. Am. Chem. Soc. 127, 4986 (2005).CrossRefGoogle Scholar
49.Ponomarenko, S.A., Kirchmeyer, S., Halik, M., Klauk, H., Zschieschang, U., Schmid, G., Karbach, A., Drechsler, D., Alpatova, N.M., Synth. Met. 149, 231 (2005).CrossRefGoogle Scholar
50.Roy, V.A.L., Zhi, Y.G., Xu, Z.X., Yu, S.C., Chan, P.W.H., Che, C.M., Adv. Mater. 17, 1258 (2005).CrossRefGoogle Scholar
51.Takimiya, K., Kunugi, Y., Toyoshima, Y., Otsubo, T., J. Am. Chem. Soc. 127, 3605 (2005).CrossRefGoogle Scholar
52.van Breemen, A.J.J.M., Herwig, P.T., Chlon, C.H.T., Sweelssen, J., Schoo, H.F.M., Benito, E.M., de Leeuw, D.M., Tanase, C., Wildeman, J., Blom, P.W.M., Adv. Funct. Mater. 15, 872 (2005).CrossRefGoogle Scholar
53.Takimiya, K., Ebata, H., Sakamoto, K., Izawa, T., Otsubo, T., Kunugi, Y., J. Am. Chem. Soc. 128, 12604 (2006).CrossRefGoogle Scholar
54.da Silva, D.A., Kim, E.G., Bredas, J.L., Adv. Mater. 17, 1072 (2005).CrossRefGoogle Scholar
55.Menard, E., Podzorov, V., Hur, S.-H., Gaur, A., Gershenson, M.E., Rogers, J.A., Adv. Mater. 16, 2097 (2004).CrossRefGoogle Scholar
56.Ong, B.S., Wu, Y.L., Liu, P., Gardner, S., Adv. Mater. 17, 1141 (2005).CrossRefGoogle Scholar
57.Wu, Y.O., Liu, P., Ong, B.S., Srikumar, T., Zhao, N., Botton, G., Zhu, S., Appl. Phys. Lett. 86, 142102 (2005).CrossRefGoogle Scholar
58.deLeeuw, D.M., Simenon, M.M.J., Brown, A.R., Einerhand, R.E.F., Synth. Met. 87, 53 (1997).CrossRefGoogle Scholar
59.Bao, Z.A., Lovinger, A.J., Brown, J., J. Am. Chem. Soc. 120, 207 (1998).CrossRefGoogle Scholar
60.Ghosh, A., Gassman, P.G., Almlof, J., J. Am. Chem. Soc. 116, 1932 (1994).CrossRefGoogle Scholar
61.Schlettwein, D., Hesse, K., Gruhn, N.E., Lee, P.A., Nebesny, K.W., Armstrong, N.R., J. Phys. Chem. B 105, 4791 (2001).CrossRefGoogle Scholar
62.Katz, H.E., Johnson, J., Lovinger, A.J., Li, W.J., J. Am. Chem. Soc. 122, 7787 (2000).CrossRefGoogle Scholar
63.Katz, H.E., Lovinger, A.J., Johnson, J., Kloc, C., Siegrist, T., Li, W., Lin, Y.-Y., Dodabalapur, A., Nature 404, 478 (2000).CrossRefGoogle Scholar
64.Katz, H.E., Otsuki, J., Yamazaki, K., Suka, A., Takido, T., Lovinger, A.J., Raghavachari, K., Chem. Lett. 32, 508 (2003).CrossRefGoogle Scholar
65.Yoon, M.H., DiBenedetto, S.A., Facchetti, A., Marks, T.J., J. Am. Chem. Soc. 127, 1348 (2005).CrossRefGoogle Scholar
66.Chen, H.Z., Shi, M.-M., Aernouts, T., Wang, M., Borghs, G., Heremans, P., Sol. Energy Mater. Sol. Cells 87, 521 (2005).CrossRefGoogle Scholar
67.Jones, B.A., Ahrens, M.J., Yoon, M., Facchetti, A., Marks, T.J., Wasielewski, M.R., Angew. Chem., Int. Ed. 43, 6363 (2004).CrossRefGoogle Scholar
68.Tatemichi, S., Ichikawa, M., Koyama, T., Taniguchi, Y., Appl. Phys. Lett. 89 (2006).Google Scholar
69.Inoue, Y., Sakamoto, Y., Suzuki, T., Kobayashi, M., Gao, Y., Tokito, S., Jpn. J. Appl. Phys., Part 1 44, 3663 (2005).CrossRefGoogle Scholar
70.Nishida, J.-i., Naraso, , Murai, S., Fujiwara, E., Tada, H., Tomura, M., Yamashita, Y., Org. Lett. 6, 2007 (2004).CrossRefGoogle Scholar
71.Babel, A., Jenekhe, S.A., J. Am. Chem. Soc. 125, 13656 (2003).CrossRefGoogle Scholar
72.Someya, T., Kato, Y., Sekitani, T., Iba, S., Noguchi, Y., Murase, Y., Kawaguchi, H., Sakurai, T., Proc. Natl. Acad. Sci. U.S.A. 102, 12321 (2005).CrossRefGoogle Scholar
73.Ghovanloo, M., Najafi, K., IEEE Trans. Neural Syst. Rehabil. Eng. 15, 449 (2007).CrossRefGoogle Scholar
74.Potyrailo, R.A., Morris, W.G., Rev. Sci. Instrum. 78 (2007).Google Scholar
75.Subramanian, V., Chang, P.C., Lee, J.B., Molesa, S.E., Volkman, S.K., IEEE Trans. Components Packaging Technol. 28, 742 (2005).CrossRefGoogle Scholar
76.Ai, Y., Gowrisanker, S., Jia, H., Trachtenberg, I., Vogel, E., Wallace, R.M., Gnade, B.E., Barnett, R., Stiegler, H., Edwards, H., Appl. Phys. Lett. 90, 262105 (2007).CrossRefGoogle Scholar
77.Steudel, S., de Vusser, S., Myny, K., Lenes, M., Genoe, J., Heremans, P., J. Appl. Phys. 99, 114519 (2006).CrossRefGoogle Scholar
78.Steudel, S., Myny, K., Arkhipov, V., Deibel, C., de Vusser, S., Genoe, J., Heremans, P., Nat. Mater. 4, 597 (2005).CrossRefGoogle Scholar
79.Ma, L.P., Ouyang, J., Yang, Y., Appl. Phys. Lett. 84, 4786 (2004).CrossRefGoogle Scholar
80.Pradhan, B., Batabyal, S.K., Pal, A.J., Appl. Phys. Lett. 89 (2006).Google Scholar
81.Jiao, S.J., Zhang, Z.Z., Lu, Y.M., Shen, D.Z., Yao, B., Zhang, J.Y., Li, B.H., Zhao, D.X., Fan, X.W., Tang, Z.K., Appl. Phys. Lett. 88, 031911 (2006).CrossRefGoogle Scholar
82.Hwang, D.K., Kim, H.S., Lim, J.H., Oh, J.Y., Yang, J.H., Park, S.J., Kim, K.K., Look, D.C., Park, Y.S., Appl. Phys. Lett. 86, 151917 (2005).CrossRefGoogle Scholar
83.Bian, J.M., Li, X.M., Zhang, C.Y., Yu, W.D., Gao, X.D., Appl. Phys. Lett. 85, 4070 (2004).CrossRefGoogle Scholar
84.Hirose, Y., Chen, W., Haskal, E.I., Forrest, S.R., Kahn, A., Appl. Phys. Lett. 64, 3482 (1994).CrossRefGoogle Scholar
85.Pal, B.N., Sun, J., Jung, B.J., Choi, E., Anreou, A.G., Katz, H.E., Adv. Mater 20, 1023 (2008).CrossRefGoogle Scholar
86.Steudel, S., Myny, K., Arkhipov, V., Deibel, C., De Vusser, S., Genoe, J., and Heremans, P., Nat. Mater. 2005, 4, 597.CrossRefGoogle Scholar
87.Torsi, L., Dodabalapur, A., Sabbatini, L., Zambonin, P.G., Sens. Actuators B 67, 312 (2000).CrossRefGoogle Scholar
88.Crone, B., Dodabalapur, A., Gelperin, A., Torsi, L., Katz, H. E., Lovinger, A. J., Bao, Z., Appl. Phys. Lett. 78, 2229 (April 9, 2001).CrossRefGoogle Scholar
89.Li, D., Borkent, E.-J., Nortrup, R., Moon, H., Katz, H.E., Bao, Z., Appl. Phys. Lett. 86, 042105 (2005).CrossRefGoogle Scholar
90.Sekitani, T., Kato, Y., Iba, S., Shinaoka, H., Someya, T., Sakurai, T., Takagi, S., Appl. Phys. Lett. 86, 073511 (2005).CrossRefGoogle Scholar
91.Sekitani, T., Iba, S., Kato, Y., Noguchi, Y., Someya, T., Sakurai, T., Appl. Phys. Lett. 87, 173502 (2005).CrossRefGoogle Scholar
92.Someya, T., Kato, Y., Sekitani, T., Iba, S., Noguchi, Y., Murase, Y., Kawaguchi, H., Sakurai, T., Proc. Natl. Acad. Sci. U.S.A. 101, 9966 (2004).CrossRefGoogle Scholar
93.Someya, T., Sakurai, T., 2003 IEEE International Electron Devices Meeting (IEDM), 8.4, Technical Digest 102, 12321 (2003).Google Scholar
94.Kawaguchi, H., Someya, T., Sekitani, T., Sakurai, T., IEEE J. Solid-State Circuits 40, 177 (2005).CrossRefGoogle Scholar
95.Kato, Y., Sekitani, T., Takamiya, M., Doi, M., Asaka, K., Sakurai, T., Someya, T., IEEE Trans. Electron Devices 54, 202 (2007).CrossRefGoogle Scholar
96.Takamiya, M., Sekitani, T., Kato, Y., Kawaguchi, H., Someya, T., Sakurai, T., IEEE J. Solid State Circuits 42, 93 (2007).CrossRefGoogle Scholar
97.Cahen, D., Naaman, R., Vager, Z., Adv. Funct. Mater. 15, 1571 (2005).CrossRefGoogle Scholar
98.Torsi, L., Dodabalapur, A., Anal. Chem. 77, 380A (2005).CrossRefGoogle Scholar
99.Bouvet, M., Anal. Bioanal. Chem. 384, 366 (2006).CrossRefGoogle Scholar
100.Locklin, J., Bao, Z.N., Anal. Bioanal. Chem. 384, 336 (2006).CrossRefGoogle Scholar
101.Mabeck, J.T., Malliaras, G.G., Anal. Bioanal. Chem. 384, 343 (2006).CrossRefGoogle Scholar
102.Wang, L., Fine, D., Sharma, D., Torsi, L., Dodabalapur, A., Anal. Bioanal. Chem. 384, 310 (2006).CrossRefGoogle Scholar
103.Katz, H.E., Huang, J., Someya, T., in Organic Electronics, Klauk, H., Ed. (Wiley, Weinheim, Germany, 2006).Google Scholar
104.Guillaud, G., Simon, J., Germain, J.P., Coord. Chem. Rev. 180, 1433 (1998).CrossRefGoogle Scholar
105.Kolesar, E.S. Jr, Brothers, C.P. Jr, Howe, C.P., Jenkins, T.J., Moosey, A.T., Shin, J.E., Wiseman, J.M., Thin Solid Films 220, 30 (1992).CrossRefGoogle Scholar
106.Torsi, L., Dodabalapur, A., Cioffi, N., Sabbatini, L., Zambonin, P.G., Sens. Actuators B 77, 7 (2001).CrossRefGoogle Scholar
107.Torsi, L., Tanese, M.C., Cioffi, N., Gallazzi, M.C., Sabbatini, L., Zambonin, P.G., Sens. Actuators B 98, 204 (2004).CrossRefGoogle Scholar
108.Liao, F., Chen, C., Subramanian, V., Sens. Actuators B 107, 849 (2005).CrossRefGoogle Scholar
109.Wang, L., Fine, D., Khondaker, S.I., Jung, T., Dodabalapur, A., Sens. Actuators B 11 3, 539 (2006).CrossRefGoogle Scholar
110.Huang, J., Miragliotta, J., Becknell, A., Katz, H.E., J. Am. Chem. Soc. 129, 9366 (2007).CrossRefGoogle Scholar
111.Huang, J., Sun, J., Katz, H.E., Adv. Mater., published online June 3, 2008, http://dx.doi.org/10.1002/adma.200703212.CrossRefGoogle Scholar
112.Yang, R.D., Gredig, T., Colesniuc, C.N., Park, J., Schuller, I.K., Trogler, W.C., Kummel, A.C., Appl. Phys. Lett. 90, 263506 (2007).CrossRefGoogle Scholar