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Low Temperature Studies Of Rare Gases Adsorbed On Molecular Sieve Materials

Published online by Cambridge University Press:  15 February 2011

Graham F. Mccann ,
I. Gameson ,
W.J. Steado ,
T. Rayment ,
P.J. Barrie  and
J. Klinowski
Graham F. Mccann
Affiliation:
University of Cambridge, Department of Chemistry, Lensfield Road, Cambridge, UK.
I. Gameson
Affiliation:
University of Cambridge, Department of Chemistry, Lensfield Road, Cambridge, UK.
T. Rayment
Affiliation:
University of Cambridge, Department of Chemistry, Lensfield Road, Cambridge, UK.
J. Klinowski
Affiliation:
University of Cambridge, Department of Chemistry, Lensfield Road, Cambridge, UK.
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Abstract

X-ray diffraction (XRD) and adsorption isotherms have long been traditional methods of characterising molecular sieves. By combining these techniques at low temperatures with variable temperature 129-Xe N.M.R. we now have a fuller understanding of the behaviour of sorbed layers inside these materials. In particular we have observed phase transformations of Xe in a polyhydroxyaluminium-pillared montmorillonite molecular sieve and have developed a model consistent with the data. In addition, using XRD, an interpillar distance of ca. 30Å was calculated. We present the first detailed low temperature studies of 129-Xe N.M.R. on these systems.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 233: Symposium U – Synthesis/Characterization and Novel Applications of Molecular Sieve Materials , 1991 , 273
Copyright
Copyright © Materials Research Society 1991

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References

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