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Damage Accumulation and Thermal Recovery in SrTiO3 Implanted with Au2+ Ions

Published online by Cambridge University Press:  15 February 2011

S. Thevuthasan ,
W. Jiang ,
W.J. Weber  and
D.E. McCready
S. Thevuthasan
Affiliation:
Pacific Northwest National Laboratory, Richland (PNNL), WA 99352, theva@pnl.gov
W. Jiang
Affiliation:
Pacific Northwest National Laboratory, Richland (PNNL), WA 99352
W.J. Weber
Affiliation:
Pacific Northwest National Laboratory, Richland (PNNL), WA 99352
D.E. McCready
Affiliation:
Pacific Northwest National Laboratory, Richland (PNNL), WA 99352
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Abstract

Damage accumulation and recovery process have been investigated in single crystal SrTiO3 irradiated with 1.0 MeV Au2+ using in-situ Rutherford Backscattering Spectrometry (RBS) in Channeling geometry. Samples were irradiated at a temperature of 200 K with ion fluences ranging from 5.0×1013 2.5×1014Au2+/cm2 (0.22 – 1.10 dpa at damage peak). Subsequent isochronal annealing experiments were performed to study damage recovery processes up to a maximum temperature of 870 K. At an ion fluence between 2.0–2.5×1014Au2+/cm2 (0.88 – 1.10 dpa), the implanted region, which is just below the surface, becomes amorphous. The recovery processes occur over a broad temperature range, and the damage created by low ion fluences, 5.0×1013 − 1.0×1014 Au2+/cm2, is almost completely recovered after annealing at 870 K.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 540: Symposium N / Microstructural Processes in Irradiated Materials , 1998 , 373
Copyright
Copyright © Materials Research Society 1999

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References

[1] White, C.W., Boatner, L.A., Sklad, P.S., McHargue, C.J., Rankin, J., Farlow, G.C., and Aziz, M.J., Nucl. Instr. and Meth. B32 (1988) pp. 11–22.Google Scholar
[2] White, C.W., McHargue, C.J., Sklad, P.S., Boatner, L.A., and Farlow, G.C., Mater. Sci. Rep. 4 (1989) pp. 41–146.Google Scholar
[3] McCallum, J.C., Rankin, J., White, C.W., and Boatner, L.A., Nucl. Instr. and Meth. B46 (1990) pp. 98–101.Google Scholar
[4] Rankin, J., McCallum, J.C., and Boatner, L.A., J. Mater. Res. 7 (1992) pp. 717–724.Google Scholar
[5] Simpson, T.W., Mitchell, I.V., McCallum, J.C., and Boatner, L.A., J. Appl. Phys. 76 (1994) pp. 2711–2718.Google Scholar
[6] Rankin, J., Sheldon, B.W., and Boatner, L.A., J. Mater. Res. 9 (1994)pp. 3113–3120.Google Scholar
[7] Overwijk, M.H.F., Cillessen, J.F.M., Kessener, Y.A.R.R., and Tenner, M.G., Nucl. Instr. and Meth. B91 (1994) pp. 322.326.Google Scholar
[8] Weber, W. J., Thevuthasan, S., Jiang, W., and McCready, D.E., presented at the 11th International Conference on Ion Beam Modification of Materials, Amsterdam, The Netherlands, August 31 – September 4, 1998 (unpublished).Google Scholar
[9] Thevuthasan, S., Jiang, W., and Weber, W.J., in preparation.Google Scholar
[10] Thevuthasan, S., Peden, C.H.F., Engelhard, M.H., Baer, D.R., Herman, G.S., Jiang, W., Liang, Y., and Weber, W.J., Nucl. Instr.Meth. A, (1998) in press.Google Scholar
[11] Feldman, L.C., Mayer, J.W., and Picraux, S.T., Materials Analysis by Ion Channeling, (Academic Press, 1982).Google Scholar