Hostname: page-component-848d4c4894-x24gv Total loading time: 0 Render date: 2024-05-17T20:33:02.741Z Has data issue: false hasContentIssue false
  • English
  • Français

Dielectric Measurement Of Multi-Layered Medium Using An Open-Ended Waveguide

Published online by Cambridge University Press:  10 February 2011

O. Tantot ,
M. Chatard-Moulin  and
P. Guillon
O. Tantot
Affiliation:
I.R.C.O.M. 123 av. A. Thomas 87060 Limoges Cedex FRANCE, tantot@ircom.unilim.fr
M. Chatard-Moulin
Affiliation:
I.R.C.O.M. 123 av. A. Thomas 87060 Limoges Cedex FRANCE, tantot@ircom.unilim.fr
P. Guillon
Affiliation:
I.R.C.O.M. 123 av. A. Thomas 87060 Limoges Cedex FRANCE, tantot@ircom.unilim.fr
Get access

Abstract

The use of a circular waveguide radiating into a multi-layered media allows the characterization of heterogeneous and fluid subtances. Many microwave measurement devices, based on reflection coefficient measurements, are subjected to air gap problems that introduce some inaccuracy in the determination of the unknown complex permittivity of the materials. Our purpose is to try and take the air gap into account in these measurements.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 430: Symposium O – Microwave Processing of Materials V , 1996 , 245
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Tantot, O., thesis, Limoges University, France, 1994.Google Scholar
2 Chevalier, B., Chatard-Moulin, M., Astier, J.P., Guillon, P., presented at the 1991 J.C.M.M., Limoges, France, pp. 275–291.Google Scholar
3 Fray, C., Chandrasekhar, K., Papernik, A., Electronic letters, 17, 718–720, 1981.Google Scholar
4 Colombo, D., in Les Transformées de Mellin et de Hankel, edited by C.N.R.S., , Paris, 1959 Google Scholar
5 Villemazet, J. F., Chatard-Moulin, M., Guillon, P., Jallageas, H., presented at the 1991 IEEE Instr. and Meas. Conference, Atlanta, 1991 (Poster Session).Google Scholar