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Difficulties in Evaluating Aging in High Voltage Underground Cables From in Situ Measurements

Published online by Cambridge University Press:  21 February 2011

Jean-Pierre Crine*
Affiliation:
Institut de recherche d'Hydro-Qufbec (IREQ), C.P. 1000, Varennes, P.Q., Canada, JOL 2P0.
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Abstract

The techniques used to evaluate HV cable aging during service are reviewed. It is concluded that none gives a satisfying evaluation of cable condition.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

[1] Details can be found in “Proc. of Workshop on Power Plant Cable Condition, Monitoring,” EPRI Report EL/NP/CS-5914-SR, Palo Alto, July 1988.Google Scholar
[2] Reynolds, P.H., in Ref. 1, p. 18–1.Google Scholar
[3] Martzloff, F.D., in Ref. 1, p. 25–1.Google Scholar
[4] Hartlein, R.A., Harper, V.S. and Ng, H.W., IEEE PES Summer meeting, paper 88-SM 516–7 (1988).Google Scholar
[5] Michel, M.C. and Bobo, J.C., J. Appl. Polym. Sci. 35, 581 (1979).Google Scholar
[6] Mashikian, M.S., in Ref. 1, p. 22–1.Google Scholar
[7] Stone, G.C. and Boggs, S.A., IEEE Trans. Elec. Insul. 17, 143 (1982).Google Scholar
[8] Weeks, W.L. and Steiner, J.P., IEEE Trans. PAS 104, No. 7 (1982).Google Scholar
[9] “Non Destructive Evaluation of XLPE Cable by Microwave Cavity Perturbation,” Can. Elec. Ass. Report 185D354, Montréal (1987).Google Scholar
[10] Bose, T.K., Merabet, M., Crine, J.-P. and Pélissou, S., IEEE Trans. Elec. Insul. 23, 319 (1988).Google Scholar
[11] Meininger, R.D., in Ref. 1, p. 19–1.Google Scholar
[12] Mopsik, F.I., Rev. Sci. Instr. 55, 79 (1984); IEEE Trans. Elec. Insul. 20, 319 (1985).Google Scholar
[13] Evers, E. and Kranz, M.G., Proc. 2nd ICPADM, p. 955, Beijing (1988).Google Scholar
[14] Gardner, J.B. and Shook, T.A., in Ref. 1, p. 20.1.Google Scholar