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Effect of Heating on the Structure of Au/GaAS Encapsulated with SiO2

Published online by Cambridge University Press:  26 February 2011

X.-F. Zeng
Affiliation:
Department of Metallurgical Engineering and Materials Science, Carnegie Mellon University, Pittsburgh, PA 15213
D. D. L. Chung
Affiliation:
Department of Metallurgical Engineering and Materials Science, Carnegie Mellon University, Pittsburgh, PA 15213
Amir Lakhani
Affiliation:
Allied/Bendix Aerospace Tech Center, 9140 Old Annapolis Road, Columbia, MD 21045
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Abstract

The structural effects of heating 1500 Å Au/GaAs (001) encapsulated with 2000 Å of SiO2 were examined by scanning electron microscopy and x-ray diffraction. It was observed that SiO2/Au/GaAs (capped) in vacuum up to 500°C remained shiny and gold in color, whereas similar heating of Au/GaAs (uncapped) caused a change of color from shiny gold to dull silver. Furthermore, mass spectroscopy showed that the amount of arsenic vapor evolved was much less for the capped sample. However, x-ray diffraction showed that Au7Ga2 formed abundantly in both types of samples after heating at 500°C, though the epitaxial relationship was AuyGa2 (001) // GaAs (001) for capped and Au7Ga2 (100) // GaAs (001) for uncapped. SEM revealed gold-rich aligned rectangular protrusions on the surfaces of SiO2/Au/GaAs as well as Au/GaAs after heating at 500°C, though the average length of these rectangles was 1.5 μm for the capped sample and 6.7 μm for the uncapped sample. Moreover, new morphological features absent in Au/GaAs were observed in SiO2/Au/GaAs. These features are a gold-rich maze with a line width of 6 Åm and gold-rich protruded lines with a line width of 9 Åm. The gold-rich protruded lines were formed by the growth and joining together of some gold-rich aligned rectangular protrusions. The gold-rich maze was observed in SiO2/Au/GaAs after heating in vacuum, but was not observed in SiO2/Au/GaAs after heating in nitrogen.

Type
Articles
Copyright
Copyright © Materials Research Society 1987

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References

REFERENCES

1. Lakhani, A. A., IEEE Electron Device Lett. EDL-6, 586 (1985).Google Scholar
2. Allan, D. A. and Thorp, S. C., Physica 129B, 445 (1985).Google Scholar
3. Lakhani, A. A., Solid-State Electronics 27, 921 (1984).Google Scholar
4. Leung, S., Wong, L. K., Chung, D. D. L. and Milnes, A. G., J. Electrochem. Soc. 130, 462 (1983).Google Scholar
5. Chung, D. D. L. and Beam, E. III, Thin Solid Films 128, 299 (1985).Google Scholar