Hostname: page-component-76fb5796d-25wd4 Total loading time: 0 Render date: 2024-04-26T23:40:35.162Z Has data issue: false hasContentIssue false

Effects of Chemical Modification of Indium-Tin-Oxide with Benzene Derivates on the Performance of Organic Photovoltaic Cells of ITO/CuPc/C60/BCP/Al

Published online by Cambridge University Press:  25 March 2011

Khayankhyarvaa Sarangerel
Affiliation:
Department of Electronics and Computer, School of Power Engineering, Mongolian University of Science and Technology, Ulaanbaatar, Mongolia
Altantsetseg Delgerjargal
Affiliation:
Center for Nanoscience and Nanotechnology and Department of Chemical Technology, School of Chemistry and Chemical Engineering, National University of Mongolia, Ulaanbaatar, Mongolia
Byambasuren Delgertsetseg
Affiliation:
Center for Nanoscience and Nanotechnology and Department of Chemical Technology, School of Chemistry and Chemical Engineering, National University of Mongolia, Ulaanbaatar, Mongolia
Chimed Ganzorig
Affiliation:
Center for Nanoscience and Nanotechnology and Department of Chemical Technology, School of Chemistry and Chemical Engineering, National University of Mongolia, Ulaanbaatar, Mongolia
Get access

Abstract

Organic thin film photovoltaic (PV) cells have attracted attention because of their ease of fabrication and potential for low cost production. In this paper, we study the effects of chemical modification of indium-tin-oxide (ITO) on the performance of organic PV cells. The organic PV cells are fabricated, with the cell configuration of ITO/copper phthalocyanine (CuPc) (20 nm)/fullerene (C60) (40 nm)/Al with and without bathocuproine (BCP) (10 nm) between C60 and Al. By the use of para-substituted benzenesulfonyl chlorides with different terminal groups of H- and Cl-, the energy offset at the ITO/CuPc interface is tuned widely depending upon the interface dipoles and thus the correlation between the change in the ITO work function and the performance of the PV cells by chemical modification is examined.

Type
Research Article
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Murray, R. W., in Electroanalytical Chemistry, Vol. 13, edited by Bard, A. J., (Marcel Dekker, New York, 1984) pp. 191368.Google Scholar
2. Fujihira, M., in Topics in Organic Electrochemistry, edited by Fry, A. J. and Britton, W. E., (Plenum, New York, 1986) pp. 255294.Google Scholar
3. Ganzorig, C. and Fujihira, M., “Chemically Modified Oxide Electrodes,” Modified Electrodes, edited by Bard, A. J. and Stratmann, M., Encyclopedia of Electrochemistry, Vol. 10, (WILEY-VCH Verlag GmbH, Weinheim, 2007) pp. 261334.Google Scholar
4. Tang, C. W., Appl. Phys. Lett. 48, 183 (1986).Google Scholar
5. Fujihira, M. and Ganzorig, C., “Molecular Control of Electron and Hole Injection at Electrodes and at Organic Layer Interfaces in Organic Electroluminescent Devices,” Conjugated Polymer and Molecular Interfaces, edited by Kahn, A., Pireaux, J. J., Salaneck, W. R., and Seki, K., (Marcel Dekker, New York, 2002) pp. 817858.Google Scholar
6. Fujihira, M., Kubota, T., and Osa, T., J. Electroanal. Chem. 119, 379 (1981).Google Scholar
7. Gardner, T. J., Frisbie, C. D., and Wrighton, M. S., J. Am. Chem. Soc. 117, 6927 (1995).Google Scholar
8. Ganzorig, C., Kwak, K. J., Yagi, K., and Fujihira, M., Appl. Phys. Lett. 79, 272 (2001).Google Scholar
9. Ganzorig, C., Sakomura, M., Ueda, K., and Fujihira, M., Appl. Phys. Lett. 89, 263501 (2006).Google Scholar
10. Sarangerel, K., Ganzorig, C., Fujihira, M., Sakomura, M., and Ueda, K., Chem. Lett. 37, 778 (2008).Google Scholar
11. Peumans, P., Yakimov, A., and Forrest, S. R., J. Appl. Phys. 93, 3693 (2003).Google Scholar
12. Fujihira, M., Annu. Rev. Mater. Sci. 29, 353 (1999).Google Scholar
13. Kim, J. S., Granstrom, M., Friend, R. H., Johansson, N., Salaneck, W. R., Daik, R., Feast, W. J., and Cacialli, F., J. Appl. Phys. 84, 6859 (1998).Google Scholar
14. Sugiyama, K., Ishii, H., Ouchi, Y., and Seki, K., J. Appl. Phys. 87, 295 (2000).Google Scholar