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Electrical Characteristics of All-Oxide S-N-S Junctions in the Normal State

Published online by Cambridge University Press:  26 February 2011

Y. Tarutani
Affiliation:
Central Research Laboratory, Hitachi, Ltd., 1–280 Higashi-Koigakubo, Kokubunji, Tokyo 185, Japan
M. Hiratani
Affiliation:
Central Research Laboratory, Hitachi, Ltd., 1–280 Higashi-Koigakubo, Kokubunji, Tokyo 185, Japan
T. Fukazawa
Affiliation:
Central Research Laboratory, Hitachi, Ltd., 1–280 Higashi-Koigakubo, Kokubunji, Tokyo 185, Japan
U. Kabasawa
Affiliation:
Central Research Laboratory, Hitachi, Ltd., 1–280 Higashi-Koigakubo, Kokubunji, Tokyo 185, Japan
A. Tsukamoto
Affiliation:
Central Research Laboratory, Hitachi, Ltd., 1–280 Higashi-Koigakubo, Kokubunji, Tokyo 185, Japan
M. Suga
Affiliation:
Central Research Laboratory, Hitachi, Ltd., 1–280 Higashi-Koigakubo, Kokubunji, Tokyo 185, Japan
K. Takagi
Affiliation:
Central Research Laboratory, Hitachi, Ltd., 1–280 Higashi-Koigakubo, Kokubunji, Tokyo 185, Japan
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Abstract

All-oxide S-N-S (superconductor-normal layer-superconductor) junctions having a planar structure are fabricated and their electrical characteristics in the normal state are investigated. The superconducting electrodes are composed of HoBa2Cu3O7−x, and the normal layer is La1.5Ba1.5Cu3O7-y. Conductance characteristics are measured and their behaviors are explained by the geometrical resonance of quasiparticles. A pair potential distribution in the normal layer is estimated from the resonance structure.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

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