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Electrochemical Modification of La2CuO4: The Role Played by Microstructure

  • E. J. Williams (a1) (a2), A. Daridon (a1) (a3), F. Arrouy (a1), J. Fompeyrine (a1) (a3), E. Mächler (a1), H. Siegenthaler (a3) and J.-P. Locquet (a1)...

Using electrochemical oxidation as a probe technique for the mechanisms by which oxidation occurs in c-axis La2CuO4 films, the vital role played by specific through-film microstructural defects has been observed using transmission electron microscopy. These defects are namely the large through-film precipitates sometimes found in these films and {111} planar faults. Two high-oxygen-content phases are formed; one locally and with a superstructure, the other of reduced orthor-hombicity and larger c-axis than as-grown material. Some films were found not to oxidize, and the defects in these films were compared with those in the oxidizable films.

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  • EISSN: 1946-4274
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