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Electrodeposition for Hi-MEMS with Special Reference to Fabrication of a Magnetic Mini-Motor

Published online by Cambridge University Press:  10 February 2011

E. J. O'Sullivan
Affiliation:
IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, NY 10598
E. I. Cooper
Affiliation:
IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, NY 10598
L. T. Romankiw
Affiliation:
IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, NY 10598
J. Horkans
Affiliation:
IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, NY 10598
K. T. Kwietniak
Affiliation:
IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, NY 10598
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Abstract

Electrodeposition through photoresist masks is a critical, enabling technology for fabrication of the thick structures (of up to several hundred microns) involved in HI-MEMS. Process integration is an important issue in HI-MEMS. The electrodeposited structure is influenced by the choice of optical or X-ray lithography. Thickness uniformity of the deposit on the wafer scale can be optimized by the use of an auxiliary cathode. On the device or feature scales, thickness uniformity can be improved by the thoughtful design of the pattern to be plated.

A variable reluctance, planar, integrated mini-motor with a 6 mm diameter rotor has been fabricated using lithography, electrodeposition and dielectric planarization processes. The rotors were fabricated separately, released from the substrate, and slipped on the shaft, which was plated up as part of the stator fabrication.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

1. See Micromachine Devices, (Cahners Publishing Co.), 1 (1996) 1.Google Scholar
2. Babich, I.V., Chainer, T., Cooper, E.I., Hegde, S., Horkans, J., Jahnes, C., Krongelb, S., Kwietniak, K.T., LaBianca, N.C., O'Sullivan, E.J. M., Romankiw, L.T., Tornello, J.A. and Trouiiloud, P., in ECS Proc. Fourth Intl. Symp. on Magnetic Materials, Processes, and Devices (1995), Romankiw, L.T. and Herman, D. Editors, 95–18(1996)505.Google Scholar
3. O'Sullivan, E.J., Cooper, E.I., Romankiw, L.T., Horkans, J., Kwietniak, K.T., Tornello, J.A., Jahnes, C., Babich, I.V., LaBianca, N.C., Krongelb, S., Hegde, S., Cotte, J.M. and Trouiiloud, P., to be published in IBM J. Res. and Develop.Google Scholar
4. Romankiw, L.T., Etching for Pattern Definition, Pub. by the The Electrochemical Society, Inc., (1976) 161193.Google Scholar
5. Romankiw, L.T., Krongelb, S., Castellani, E.E., Powers, J., Pfeiffer, A.T. and Stoeber, B., in Proc. Imi Conf. on Magnetics ICM-73, Moscow, USSR, 6 (1973) 104.Google Scholar
6. Romankiw, L.T., Croll, I.M. and Hatzakis, M., IEEE Trans. Mag–6, 4 (1970) 729.Google Scholar
7. Becker, E.W., Ehrfeld, W., Hagman, P., Maner, A. and Munchmeyer, D., Microelectron. Eng. 4 (1986) 35.Google Scholar
8. Spiller, E., Feder, R., Topalian, J., Castellani, E.E., Romankiw, L.T. and Heritage, M., Solid State Technol., April (1976) 62.Google Scholar
9. For Permalloy, see Andricacos, P.C. and Romankiw, L.T., Adv. in Electrochem. Sei. and Eng., Gerischer, H. and Tobias, C. W. Editors, 3 (1994) 225321.Google Scholar
10. Mehdizadeh, S., Dukovic, J., Andricacos, P.C. and Romankiw, L.T., J. Electrochem. Soc., 137 (1990) 110.Google Scholar
11. Powers, J.V. and Romankiw, L.T.. U.S. Pat., 3.652,442(1972).Google Scholar
12. Romankiw, L.T., in Ref. 2, p. 253.Google Scholar
13. Mehdizadeh, S., Dukovic, J., Andricacos, P.C., Romankiw, L.T. and Cheli, H.Y., J. Electrochem. Soc., 139 (1992)78.Google Scholar
14. Mehdizadeh, S., Dukovic, J., Andricacos, P.C., Romankiw, L.T. and Cheli, H.Y., J. Electrochem. Soc., 140 (1993)3497.Google Scholar
15. Castellani, E.E., Powers, J.V. and Romankiw, L.T., U.S. Pat. 4,102,756(1978).Google Scholar
16. Anderson, N.C. and Grover, C.R. Jr, U.S. Pat. 3,652,442 (1972).Google Scholar
17. Chainer, T. and Romankiw, L.T., in Ref. 2, p. 482.Google Scholar
18. Trouiiloud, P.L., in Ref. 2, 493.Google Scholar
19. Babich, I.V., Chainer, T., Cooper, E.I., Hegde, S., Horkans, J., Jahnes, C., Krongelb, S., Kwietniak, K.T., LaBianca, N.C., O'Sullivan, E.J. M., Romankiw, L.T., Tornello, J.A. and Trouiiloud, P., to appear in IEEE Trans. Mag., Sept. 1997.Google Scholar
20. Romankiw, L.T. et al., paper to appear in proceedings of Harmst '97 (Worldwide Liga Forum), June 20–21, 1997.Google Scholar