Hostname: page-component-848d4c4894-ndmmz Total loading time: 0 Render date: 2024-06-09T14:48:50.567Z Has data issue: false hasContentIssue false

Electron Irradiated InP: A Positron Annihilation Study

Published online by Cambridge University Press:  03 September 2012

T. Bretagnon
Affiliation:
Department of Physics, University of Winnipeg R3B 2E9 Winnipeg, MB, Canada.
S. Dannefaer
Affiliation:
Department of Physics, University of Winnipeg R3B 2E9 Winnipeg, MB, Canada.
D. Kerr
Affiliation:
Department of Physics, University of Winnipeg R3B 2E9 Winnipeg, MB, Canada.
Get access

Abstract

Positron lifetime measurements show that electron irradiation produces indium vacancy related defects in InP. Divacancies are also found in semi-insulating and lightly doped p and n-type materials. Temperature investigations show a change in the divacancy charge state.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Sibillearid, A., Bourgoin, J. C.. Appl. Phys. Lett. 41, 956 (1982).CrossRefGoogle Scholar
2. Sibille, A., Suski, J. and Gilleron, M.. J. Appl. Phys. 60, 595 (1986).CrossRefGoogle Scholar
3. Bretagnon, T., Bastide, G., Rouzeyre, M., Delerue, C. and Lannoo, M.. Phys. Rev. B 42 (17), 11042 (1990).CrossRefGoogle Scholar
4. Kennedy, T. A. and Wilsey, W. D.. Appl. Phys. Lett. 44 (11), 1089 (1984).Google Scholar
5. von Bardeleben, H. J.. Solid State Comm. 57, 137 (1986).CrossRefGoogle Scholar
6. Dannefear, S. in Defect Control in Semiconductors (Elsevier Science Publishers, 1990), p. 1561.CrossRefGoogle Scholar
7. Dlubek, G. and Krause, R.. Phys. stat. sol. (a) 102, 443 (1987).Google Scholar
8. Bretagnon, T., Dannefear, S. and Kerr, D. in Defects in Semiconductors 16 (Materials Science Forum vol. 83–87, 1992), p. 1021.Google Scholar
9. Kirkegaard, P., Eldrup, M., Mogensen, M. and Pedersen, N. J.. Comput. Phys. Commun. 23, 307 (1981).Google Scholar
10. Puska, M. J., Makinen, S., Manninen, M. and Nieminen, R. J.. Phys. Rev. B 39, (11), 7666 (1989).CrossRefGoogle Scholar
11. Positron in Solid. ed. by Hautojarvi, P. (Topics in Current Physics vol. 12, Springer Verlag, 1979).Google Scholar
12. Saarinen, K., Hautojarvi, P., Lanki, P. and Corbel, C.. Phys. Rev. B 44 (19), 10585 (1991).Google Scholar
13. Laasosen, K., Alatalo, M., Puska, M. J. and Nieminen, R. M.. J. Phys.: Condens. Matter 3, 7217 (1991).Google Scholar
14. Dannefear, S., Mascher, P. and Kerr, D.. J. Phys.: Condens. Matter 1, 3213 (1989).Google Scholar
15. Ando, K. and Katsui, A. in Defect Control in Semiconductors (Elsevier Science Publishers, 1990), p. 921.Google Scholar
16. Gislason, H. P., Sun, H., Peale, R. E. and Wattkins, G. D. in Defects in Semiconductors 16 (Materials Science Forum vol. 83–87, 1992), p. 905.Google Scholar