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Electron Microscopy of the Operation of Nanoscale Devices

Published online by Cambridge University Press:  01 February 2011

John Cumings ,
David Goldhaber-Gordon ,
A. Zettl ,
M.R. McCartney  and
J. C. H. Spence
John Cumings
Affiliation:
Department of Physics, Stanford University, Stanford, California;
David Goldhaber-Gordon
Affiliation:
Department of Physics, Stanford University, Stanford, California;
A. Zettl
Affiliation:
Department of Physics, University of California, Berkeley, California; Materials Sciences Division, Lawrence Berkeley National Lab, Berkeley, California;
M.R. McCartney
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, Arizona;
J. C. H. Spence
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, Arizona.
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Abstract

A transmission electron microscope (TEM) is much more than just a tool for imaging the static state of materials. To demonstrate this, we present work on studying the mechanical and electrical properties of carbon nanotube devices. Multiwall carbon nanotubes are concentrically stacked tubular sheets of graphite, where the spacing between each cylinder is simply the natural spacing of graphite. Using a custom-built in-situ nanomanipulation probe, we have shown that it is possible to slide the nanotube layers in a telescopic extension mode that exhibits low friction, demonstrating the potential of nanotubes as the ultimate synthetic nanobearing. During this telescopic extension, the electrical resistance of the nanotube devices increases, opening the possibility that these devices can also be used as nanoscale rheostats. We also briefly describe work on using electron holography inside a TEM to study the electric field distribution in nanotube field-emission devices and on using a nanotube itself as a biprism for electron holography. These measurements together demonstrate the wealth of information that can be obtained and frontiers that can be opened by putting operational nanodevices inside an electron microscope.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 839: Symposium P – Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry, and Structure , 2004 , P7.1
Copyright
Copyright © Materials Research Society 2004

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References

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