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A High Performance UV Photodetector from Thin Film Diamond

Published online by Cambridge University Press:  10 February 2011

Robert D. Mckeag ,
Michael D. Whitfield ,
Simon Sm Chan ,
Lisa Ys Pang  and
Richard B. Jackman
Robert D. Mckeag
Affiliation:
University College London, Electronic and Electrical Engineering, Torrington Place, London, WC1E 7JE, UK
Michael D. Whitfield
Affiliation:
University College London, Electronic and Electrical Engineering, Torrington Place, London, WC1E 7JE, UK
Simon Sm Chan
Affiliation:
University College London, Electronic and Electrical Engineering, Torrington Place, London, WC1E 7JE, UK
Lisa Ys Pang
Affiliation:
University College London, Electronic and Electrical Engineering, Torrington Place, London, WC1E 7JE, UK
Richard B. Jackman
Affiliation:
University College London, Electronic and Electrical Engineering, Torrington Place, London, WC1E 7JE, UK
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Abstract

Thin film diamond has been used to fabricate a photodetector which displays high sensitivity to deep UV light, with an external quantum efficiency of greater than one, a dark current of less than 0.1nA and which is near ‘blind’ to visible light.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 416: Symposium DD – Diamond for Electronic Applications , 1995 , 419
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

1. Field, J.E., Ed., “The properties of natural and synthetic diamond”(Academic press, London 1992)Google Scholar
2. Bhardway, P.K., Code, R.F., van Driel, H.M. and Walentynowicz, E. Appl. Phys. Lett., 43, 207 (1983)Google Scholar
3. Zhu, W., Stoner, B.R., Williams, B.E. and Glass, J.T., Proc. IEEE 79 621 (1991)Google Scholar
4. McKeag, R D, Chan, S S M and Jackman, R B Appl. Phys. Letts., 67, 2117 (1995)Google Scholar
5. Binari, S.C, Marchywka, M, Koolbeck, D.A., Dietrich, H.B. and Moses, D. Dia. & Rel. Mat., 2, 1020 (1993)Google Scholar
6. Chan, S S M, Peucheret, C, McKeag, R D, Johnston, C Chalker, P R and Jackman, R B J. Appl. Phys., 78, 2877 (1995)Google Scholar
7. Whitfield, M D, Chan, S S M and Jackman, R B Appl. Phys. Letts., (In Press)Google Scholar
8. Baral, B, Chan, S S M and Jackman, R B J. Vac. Sci. Tech., (In Press)Google Scholar