Hostname: page-component-848d4c4894-x24gv Total loading time: 0 Render date: 2024-05-15T19:33:39.528Z Has data issue: false hasContentIssue false
  • English
  • Français

High Temperature Dielectric Property Measurements - An Insight into Microwave Loss Mechanisms in Engineering Ceramics

Published online by Cambridge University Press:  15 February 2011

J. G. P. Binnen ,
T. E. Cross ,
N. R. Greenacre  and
M. Naser-Moghadasi
J. G. P. Binnen
Affiliation:
Department of Materials Engineering and Materials Design, The University of Nottingham, University Park, Nottingham, UK NG7 2RD
T. E. Cross
Affiliation:
Department of Electrical and Electronic Engineering, The University of Nottingham, University Park, Nottingham, UK NG7 2RD
N. R. Greenacre
Affiliation:
Department of Electrical and Electronic Engineering, The University of Nottingham, University Park, Nottingham, UK NG7 2RD
M. Naser-Moghadasi
Affiliation:
Department of Electrical and Electronic Engineering, The University of Nottingham, University Park, Nottingham, UK NG7 2RD
Get access

Abstract

It is now possible, in a number of laboratories worldwide, to make microwave dielectric property measurements at temperatures up to about 1500°C. These measurements have shown that the loss tangent, tanδ, of a wide range of engineering ceramics increases dramatically at elevated temperatures. The interaction between the ceramic material and the impurities present during processing can have a dramatic effect on both the ease with which the material is able to extract energy from the microwave field and on the properties of the final ceramic. While the effect of impurities on the ceramic properties is relatively well understood the effect of impurities on the microwave loss mechanisms at elevated temperatures is not. This paper will review some of the recent work on the high temperature microwave dielectric property measurements performed at Nottingham.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 347: Symposium O – Microwave Processing of Materials IV , 1994 , 247
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Arai, M, Binner, JGP, Carr, GE and Cross, TE in Microwaves: Theory and Application in Materials Processing II, edited by Clark, DE, Tynga, WR, Laia, JR Jr (Ceramic Trans. 36, Cincinatti, 1993) pp 483–492 Google Scholar
2 Hutcheon, RM, de Jong, MS, Adams, FP, Lucuta, PG, McGregor, JE and Banan, L in Microwave Processing of Materials III, edited by Beatty, RL, Sutton, WH and Iskander, MF (Mater. Res. Soc. Proc. 269, San Francisco, 1992) pp 541–551 Google Scholar
3 See for example Moulson, AJ and Herbert, LM, “Electroceramics: Materials, Properties, Applications” (Chapman Hall, 1990) p32 Google Scholar