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Incoherent Imaging by Z-Contrast Stem: Towards 1Å Resolution

Published online by Cambridge University Press:  21 February 2011

S. J. Pennycook ,
D. E. Jesson  and
A. J. Mcgibbon
S. J. Pennycook
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6030
D. E. Jesson
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6030
A. J. Mcgibbon
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6030
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Abstract

By averaging phase correlations between scattered electrons a high angle detector in the scanning transmission electron microscope (STEM) can provide an incoherent, Z-contrast image at atomic resolution. Phase coherence is effectively destroyed through a combination of detector geometry (transverse incoherence) and phonon scattering (longitudinal incoherence). Besides having a higher intrinsic resolution, incoherent imaging offers the possibility of robust reconstruction to higher resolutions, provided that some lower frequency information is present in the image. This should have value for complex materials and regions of complex atomic arrangements such as grain boundaries. Direct resolution of the GaAs sublattice with a 300kV is demonstrated.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 332: Symposium U – Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy , 1994 , 607
Copyright
Copyright © Materials Research Society 1994

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