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Intra-Grain and Oligo-Grain Top-Contact Organic Thin film Transistors

Published online by Cambridge University Press:  15 February 2011

Stijn Verlaak ,
Stijn De Jonge ,
Stijn Noppe ,
Dimitri Janssen ,
Soeren Steudel ,
Stijn De Vusser  and
Paul Heremans
Stijn Verlaak
Affiliation:
Polymer and Molecular Electronics group, IMEC, Kapeldreef 75, B-3001 Leuven, Belgium.
Stijn De Jonge
Affiliation:
Polymer and Molecular Electronics group, IMEC, Kapeldreef 75, B-3001 Leuven, Belgium.
Stijn Noppe
Affiliation:
Polymer and Molecular Electronics group, IMEC, Kapeldreef 75, B-3001 Leuven, Belgium.
Dimitri Janssen
Affiliation:
Polymer and Molecular Electronics group, IMEC, Kapeldreef 75, B-3001 Leuven, Belgium.
Soeren Steudel
Affiliation:
Polymer and Molecular Electronics group, IMEC, Kapeldreef 75, B-3001 Leuven, Belgium.
Stijn De Vusser
Affiliation:
Polymer and Molecular Electronics group, IMEC, Kapeldreef 75, B-3001 Leuven, Belgium.
Paul Heremans
Affiliation:
Polymer and Molecular Electronics group, IMEC, Kapeldreef 75, B-3001 Leuven, Belgium.
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Abstract

We describe and demonstrate a micromachined shadowmask that allows the realization of intra-grain and oligo-grain top-contact organic thin film transistors (OTFTs). First experimental results of OTFT's show that for small channel lengths, grain boundary barriers indeed appear to dominate the output characteristics of OTFTs.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 771: Symposium L – Organic and Polymeric Materials and Devices , 2003 , L6.9
Copyright
Copyright © Materials Research Society 2003

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References

1. Street, R.A. and Salleo, A., Appl. Phys. Lett. 81, 2887–2889 (2002).Google Scholar
2. Verlaak, S., Steudel, S., Janssen, D., Heremans, P. and Deleuze, M., to be published.Google Scholar
3. Dimitriadis, C.A. and Tassis, D.H., J. Appl. Phys. 77, 2177–2183 (1995).Google Scholar