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Intrinsic Josephson Junctions on High-quality BSCCO-2212/2223 Superlattice Thin Films Grown by MOCVD

Published online by Cambridge University Press:  18 March 2011

K. Endo
Affiliation:
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568, Ibaraki, Japan
H. Sato
Affiliation:
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568, Ibaraki, Japan
T. Yoshizawa
Affiliation:
Tokyo Denki Univ., Kanda 101-8457, Tokyo, Japan
K. Abe
Affiliation:
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568, Ibaraki, Japan
J. Itoh
Affiliation:
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568, Ibaraki, Japan
K. Kajimura
Affiliation:
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568, Ibaraki, Japan
H. Akoh
Affiliation:
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8568, Ibaraki, Japan
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Abstract

We report on the successful preparation of intrinsic Josephson junctions on high-quality BSCCO-2212/2223 superlattice thin films grown by MOCVD. The surface of as-grown films was very smooth with the roughness of the order of a half unit cell. Mesas were effectively structured on the film by the liquid-nitrogen-cooled dry etching method. A typical I-V characteristic in the c-axis direction of a BSCCO film shows the hysteresis and multiple resistive branches. The number of branches is consistent with that of junctions calculated from the height of a mesa structure. This indicates that BSCCO-2212/2223 superlattice films consist of a series array of S(CuO2 bilayer) / I(SrO, BiO layers) / S(CuO2 trilayer) junction. The formation of stacked Josephson junctions was also confirmed by the temperature dependence and the magnetic field dependence of Ic.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

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References

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