Hostname: page-component-848d4c4894-2pzkn Total loading time: 0 Render date: 2024-05-15T10:48:28.142Z Has data issue: false hasContentIssue false

Kinetics of Ni Silicides Synthesis with Excimer Laser Pulses Studied by TRR

Published online by Cambridge University Press:  03 September 2012

R. Černý
Affiliation:
Department of Physics, Faculty of Civil Engineering, Czech Technical University, Thátkurova 7, 166 29 Prague 6
P. PŘkryl
Affiliation:
Mathematical Institute, Czech Academy of Sciences, Zitnd 25, 115 67 Prague 1
K.M.A. El-Kader
Affiliation:
Institute of Physics, Czech Academy of Sciences, Cukrovarnickd. 10, 162 00 Prague 6
P. Engst
Affiliation:
The Heyrovský Institute of Physical Chemistry and Electrochemistry, Dolejškova 3, 182 23 Prgue 8
P. KubÁt
Affiliation:
The Heyrovský Institute of Physical Chemistry and Electrochemistry, Dolejškova 3, 182 23 Prgue 8
V. ChÁb
Affiliation:
Institute of Physics, Czech Academy of Sciences, Cukrovarnickd. 10, 162 00 Prague 6
Get access

Abstract

Time resolved reflectivity curves (TRR) in combination with non-equilibrium thermal model are used to estimate the temperature interval of chemical reactions in the systems Ni-Si (100) and Ni-SiO2-Si (100) for a ∼ 500 nm thick Ni layer depending on the pulse energy density ranging from 0.5 J/cm 2 to 1.0 J/cm2. Numerical simulations are performed to calculate the temperature field within the system and to analyze the reactivity of the system.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Kaenel, H. von, Sci. Rep. 8 (5), 1 (1990).Google Scholar
2. D'Anna, E., Leggieri, G. and Luches, A., Appl. Phys. A 45, 325 (1988).Google Scholar
3. Jellison, G.E. Jr., Lowndes, D.H., Mashburn, D.N. and Wood, R.F., Phys.Rev.B 34, 2407 (1986).Google Scholar
4. Dohnálek, Z., Cháb, V., Lukeg, I. and Šášik, R., Proc. of LAMP'92, Nagaoka, Japan, June 1992, 275.Google Scholar
5. Černý, R., Šášik, R., Lukeg, I. and Chdtb, V., Phys. Rev. B 44, 4097 (1991).CrossRefGoogle Scholar
6. Lukeš, I., Šášik, R. and Černý, R., Appl. Phys. A 54, 327 (1992).Google Scholar
7. Engel, T., Surface Sci. Rep. 18 (4), 91 (1993).Google Scholar