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Measurements of Strain Induced Resistivity by the Eddy-Current Decay Method

Published online by Cambridge University Press:  21 February 2011

K. Theodore Hartwig*
Affiliation:
Texas A&M University, Department of Mechanical Engineering, College Station, TX 77843-3123.
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Abstract

The eddy-current decay method developed by Bean for electrical resistivity measurements is well-suited for bulk metal characterization studies. The technique can be applied to investigations of low temperature plastic strain in pure aluminum.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

1. Fickett, F.R., in Materials at Low Temperatures, edited by Reed, R.P. and Clark, A.F. (ASM, Metals Park, Ohio, 1983), p. 165.Google Scholar
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