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Mixed Metal Oxide Interfaces: An Experimental and Theoretical Assessment of Secondary Metal Influences in Metal Impregnated Aluminas

Published online by Cambridge University Press:  15 February 2011

M. Malaty
Affiliation:
Temple University, Phila. PA 19122;
D. Singh
Affiliation:
Temple University, Phila. PA 19122;
R. Schaeffer
Affiliation:
Temple University, Phila. PA 19122;
S. Jansen
Affiliation:
Temple University, Phila. PA 19122;
S. Lawrence
Affiliation:
Saginaw Valley State University, University Center, MI 48710
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Abstract

Studies of the mixed-metal interface in metal impregnated alumina have indicated the possibility of much metal-metal and metal-substrate interaction. Studies were carried out on NiCu/Al2O3 system which was evaluated to develop a better understanding of the forces that drive modification of the catalytic selectivity of Ni in the presence of Cu. Electron Paramagnetic Resonance (EPR), Powder X-ray Photoelectron Spectroscopy (XPS), X-ray Diffraction (XRD) and theoretical calculations were carried out on this bimetallic system, using Ni,Ag/Al2O3 as a reference as Ni shows negligible electron perturbation on co-adsorbance with Ag onto alumina. XRD results indicate that gross modification of the electronic fields of Ni and Cu are due to direct coupling and intercalation into the alumina matrix. As a result of this phenomena, these materials may form a good base for the development of novel ceramics based on mixed-metal interactions where the intermetallic perturbations are driven by the substrate effects.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1. Clarke, J. K. A., Chem. Rev. 1975, 75(3), 291 Google Scholar
2. Sinfelt, J. H., Accts. Chem. Res. 1983, 10, 15 Google Scholar
3. Cale, T. S., Richardson, J. T., J. Catal. 1983, 79, 378 Google Scholar
4. Lawrence, S. S, Ph.Dissertation, D., Univ. of Missouri-St. Louis, 1989, (DA8922404)Google Scholar
5. McMardee, H. F., Morris, M. C., Evans, E. H., Paretzkin, B., Wong-Ng, W., “Methods and Practices in X-ray Diffraction,” Jenkins, R.(ed.), International Center for Diffraction Data, Swarthmore, PA, 1990, sec. 5.5.1.Google Scholar
6. Levason, W., Spicer, M., Coord. Chem. Rev. 1987, 76, 45. M.Melnick, R.V.Parish, Coord. Chem. Rev. 1987, 156. H.Shmidbaur, K. C.Dash, Adv. Inorg. Chem. Radiochem. 1982, 25, 236Google Scholar