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Modulating Functions Waveform Analysis of Multi-Exponential Transients for Deep-Level Transient Spectroscopy

Published online by Cambridge University Press:  25 February 2011

C. M. Ransom ,
T. I. Chappell ,
J. L. Freeouf  and
P. D. Kirchner
C. M. Ransom
Affiliation:
IBM Corporation, T.J. Watson Research Center, Yorktown Heights, N.Y. 10598
T. I. Chappell
Affiliation:
IBM Corporation, T.J. Watson Research Center, Yorktown Heights, N.Y. 10598
J. L. Freeouf
Affiliation:
IBM Corporation, T.J. Watson Research Center, Yorktown Heights, N.Y. 10598
P. D. Kirchner
Affiliation:
IBM Corporation, T.J. Watson Research Center, Yorktown Heights, N.Y. 10598
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Abstract

An improved method for the analysis of multi-exponential transients with high resolution has been applied to DLTS. Full-waveform fittings, using the technique of Modulating Functions, are made to digitized transients captured by a computer. This technique is described and results for both simulated data (with noise) and real data are shown. The advantages over previously published techniques in resolution, calculation speed, insensitivity to truncation error and noise are discussed. Also, how this method allows for a determination of the number of components is presented.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 69: Symposium D – Materials Characterization , 1986 , 337
Copyright
Copyright © Materials Research Society 1986

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