Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-29T02:05:02.886Z Has data issue: false hasContentIssue false

MOVPE Growth of GaPAsN Quaternary Alloys Lattice-Matched to GaP

Published online by Cambridge University Press:  10 February 2011

Goshi Biwa
Affiliation:
Department of Applied Physics, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113Japan, onabe@photonics. rcaste.u-tokyo.ac.jp
Hiroyuki Yaguchi
Affiliation:
Department of Applied Physics, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113Japan, onabe@photonics. rcaste.u-tokyo.ac.jp
Kentaro Onabe
Affiliation:
Department of Applied Physics, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113Japan, onabe@photonics. rcaste.u-tokyo.ac.jp
Yasuhiro Shiraki
Affiliation:
Reasearch center for advanced science and Technology(RCAST), The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153 Japan
Get access

Abstract

GaP1-x-yAsyNx. (x ∼,2.3%, 0< y <19%) quaternary alloy semiconductor films on GaP substrates have been successfully grown by metalorganic vapor phase epitaxy (MOVPE). With the fixed supplies of trimethylgallium(TMG), AsH3 and dimethylhydrazine(DMHy) during the growth, the As concentration in the solid increased with increasing AsH3 supply, while the N concentration was almost unaffected. It has been demonstrated that the crystalline quality of the alloy films is much improved with the close lattice-matching to the GaP substrate, giving a superior surface morphology without any cross-hatches, a much narrower x-ray diffraction linewidth, and a significantly higher photoluminescence(PL) intensity.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Baillargeon, J. N., Cheng, K. Y., Holfer, G. E., Pearah, P. J., and Hsieh, K. C., Appl. Phys. Lett. 60, 2540 (1992).Google Scholar
2. Miyoshi, S., Yaguchi, H., Onabe, K., and Ito, R., Appl. Phys. Lett. 63, 3506 (1993).Google Scholar
3. Miyoshi, S., Yaguchi, H., Onabe, K., Shiraki, Y. and Ito, R., Inst. Phys. Conf. Ser. No. 141, p. 97 (1995).Google Scholar
4. Bi, W.G. and Tu, C.W., Appl. Phys. Lett. 69, 3710 (1996).Google Scholar
5. Yaguchi, H., Miyoshi, S., Arimoto, H., Saito, S., Akiyama, H., Onabe, K., Shiraki, Y. and Ito, R., Inst. Phys. Conf. Ser. No. 145, p. 307 (1996).Google Scholar
6. Miyoshi, S. and Onabe, K., Solid State Electron. 41, 267 (1997).Google Scholar
7. Capizzi, M., Modesti, S., Martelli, F., and Frova, A., Solid State Commun. 39, 333 (1981).Google Scholar
8. Yaguchi, H., Miyoshi, S., Arimoto, H., Saito, S., Akiyama, H., Onabe, K., Shiraki, Y., and Ito, R., Solid State Electron. 41 231 (1997).Google Scholar
9. Miura, Y., Onabe, K., Zhang, X., Nitta, Y., Fukatsu, S., Shiraki, Y., and Ito, R., Jpn. J. Appl. Phys. 30, L664 (1991).Google Scholar