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A New Method to Characterize Dislocation Loops

Published online by Cambridge University Press:  15 February 2011

Fuping Liu ,
Ian Baker  and
Michael Dudley
Fuping Liu
Affiliation:
Thayer School of Engineering, Dartmouth College, Hanover, NH 03755, USA
Ian Baker
Affiliation:
Thayer School of Engineering, Dartmouth College, Hanover, NH 03755, USA
Michael Dudley
Affiliation:
Dept. of Materials Science, State University of New York at Stony Brook, Stony Brook, NY 11794, USA
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Abstract

White-beam synchrotron X-ray topography has been used to study the circular, prismatic, [0001] dislocation loops which are commonly-observed on the (0001) plane in polycrystalline, freshwater ice. A new method, involving detailed analyses of the effects of beam divergence on the loop images, has been developed to determine whether a loop is of vacancy or interstitial type. In an 0002 image, one half of a loop (projected as an ellipse) appears as a single image and the other half as a double image. Experimentally, it was found that the 0002 vector drawn from the center of a loop passes through the single image if the loop is of vacancy-type and through the double image if a loop is of interstitial-type. This method of loop characterization was confirmed by performing theoretical analyses of both the dislocation image widths and their strain fields.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 375: Symposia AA – Applications of Synchrotron Radiation Techniques to Materials Science , 1994 , 319
Copyright
Copyright © Materials Research Society 1995

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