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Observation and Analysis of Self-Diffraction in Bacteriorhodopsin Films

Published online by Cambridge University Press:  15 February 2011

Richard B. Gross
Affiliation:
Department of Chemistry & W.M. Keck Center for Molecular Electronics, Syracuse University, Syracuse, NY 13244.
Zhongping Chen
Affiliation:
Department of Chemistry & W.M. Keck Center for Molecular Electronics, Syracuse University, Syracuse, NY 13244.
Robert R. Birge
Affiliation:
Department of Chemistry & W.M. Keck Center for Molecular Electronics, Syracuse University, Syracuse, NY 13244.
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Abstract

High order self-diffraction is observed from a 5.2 OD570 thin film containing chemically enhanced bacteriorhodopsin. Up to fourteen diffracted orders (±7) could be discerned by eye at a laser intensity of 23 mW/cm2. The results for the first and second order diffracted beams are analyzed in terms of a modified form of the recent self-diffraction model proposed by Fragnito et al.[1].

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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References

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