Hostname: page-component-848d4c4894-ndmmz Total loading time: 0 Render date: 2024-05-23T15:39:14.544Z Has data issue: false hasContentIssue false

Optical Anisotropy of the Optical Response for Strained GaN Epilayers Grown Along the <10–10> Direction

Published online by Cambridge University Press:  10 February 2011

A. Andenet
Affiliation:
CNRS-GES, Université de Montpellier II, -Case courrier 074 – 34095 Montpellier Cedex 5 France
B. Gil
Affiliation:
CNRS-GES, Université de Montpellier II, -Case courrier 074 – 34095 Montpellier Cedex 5 France
Y.-M. Le Vaillant
Affiliation:
CNRS-GES, Université de Montpellier II, -Case courrier 074 – 34095 Montpellier Cedex 5 France
S. Clur
Affiliation:
CNRS-GES, Université de Montpellier II, -Case courrier 074 – 34095 Montpellier Cedex 5 France
O. Briot
Affiliation:
CNRS-GES, Université de Montpellier II, -Case courrier 074 – 34095 Montpellier Cedex 5 France
R. L. Aulombard
Affiliation:
CNRS-GES, Université de Montpellier II, -Case courrier 074 – 34095 Montpellier Cedex 5 France
Get access

Abstract

Group theory states that the spectroscopy of excitons in GaN epilayers grown with biaxial stress on M Plane (10–10)-oriented substrates is strongly anisotropie in the growth plane, in contrast to the situation if growth occurs on conventional C plane substrates. In addition, we predict existence of nine radiative transitions instead of five, three for each family of A, B, and C excitons. We calculate the in-plane anisotropy and show that, due to the crossed configuration of the wurtzite crystal field and the built-in strain one, the A exciton is significantly coupled to the electromagnetic field in π polarization (E//c).

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1]-see for instance chapter 1 of «Gallium Nitride and Related Materials” in Materials Research Society Symposium Proceedings volume 395 of Edited by Ponce, F.A., Dupuis, R.D., Nakamura, S., and Edmond, J.A. (1996)Google Scholar
[2] Matsuoka, T., Materials Research Society Symposium Proceedings volume 395 Edited by Ponce, F.A., Dupuis, R.D., Nakamura, S., and Edmond, J.A., 39 (1996)Google Scholar
[3] Susuki, M., and Uenoyama, T., Jpn. J. Appl. Phys. 35, L953, (1995)Google Scholar
[4]in this paper, we use the notationsof «Semiconductor Optics» by Klingshirn, C.F. Springer Verlag-Berlin Heidelberg New York (1995)Google Scholar
[5] Gil, B. and Briot, O., Phys. Rev. B. 55, 2530, (1997)Google Scholar
[6] Gil, B., Briot, O., and Aulombard, R.L., Phys. Rev. B 52, R 17 028, (1995)Google Scholar
[7] Gil, B., Hamdani, F. and Morkoç, H., Phys. Rev. B, 54, 7680, (1996)Google Scholar
[8] Tchounkeu, M., Briot, O., Gil, B., and Aulombard, R.L. J. of Applied Physics 80, 5352, (1996)Google Scholar
[9] Shikanai, A., Azuhata, T., Sota, T., Chichibu, S., Kuramata, A., Horino, K., and Nakamura, S. J. Appl. Phys. 81, 417, (1997)Google Scholar