Hostname: page-component-76fb5796d-9pm4c Total loading time: 0 Render date: 2024-04-26T22:49:17.179Z Has data issue: false hasContentIssue false

Optical Properties of Soot Remelted Silica Irradiated with Excimer Lasers

Published online by Cambridge University Press:  15 February 2011

Yasutaka Matsumoto
Affiliation:
Graduate student of Faculty of Eng. Tokai Univ.
Nobu Kuzuu
Affiliation:
Nippon Silica Glass Yamaguchi Co., 4555 Kaisei-cho, Shin-Nanyo, Yamaguchi 746, JAPAN
Masataka Murahara
Affiliation:
Faculty of Eng. Tokai Univ.,1117 Kitakaname, Hiratsuka, Kanagawa 259-12, JAPAN
Get access

Abstract

Characteristics of ArF laser induced luminescence, and absorption bands in soot remelted silica, before and after annealing in various atmospheres, were investigated. A soot remelted silica containing no OH has an absorption band at 5.1 eV which can be annealed out with H2, but an absorption band at 5.8 eV is induced by subsequent the ArF laser irradiation. In a soot remelted silica containing 50 ppm of OH, an emission band at 1.9 eV was induced by the ArF laser irradiation. The 1.9 eV band can be annealed out with He and H2, but, by annealing in H2, the 5.8 eV absorption band was induced by the ArF laser irradiation as in the case of the silica containing no OH.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Izawa, T., Kobayashi, S., Sudo, S., and Hanawa, F.: Trans. Inst. Electron. commun. Eng. Jan. E62, 779 (1979).Google Scholar
[2] Okada, K., Tanaka, H., and Kubo, U.: presented at the 9-th annual Meetings of the Laser Society of JPN. 26aV3, Jan. 1989, Osaka, Japan.Google Scholar
[3] Kuzuu, N., Komatsu, Y., and Murahara, M.: in Optical Fiber Materials and Processing, edited by Fleming, J. W., Sigle, G. H. Jr., Takahashi, S., and France, P. W., (Mat. Res. Soc. Proc. 172, Pittsburgh, PA, 1990) pp.119123.Google Scholar
[4] Kuzuu, N., Komatsu, Y., and Murahara, M.: Phys. Rev. B 44, 9265 (1991).CrossRefGoogle Scholar
[5] Griscom, D. L.: J. Ceram. Soc. Jpn. 99, 923 (1991).CrossRefGoogle Scholar
[6] Imai, H., Arai, K., Imagawa, H., Hosono, H., and Abe, Y.: Phys. Rev. B 38, 12772 (1988).CrossRefGoogle Scholar
[7] Tohmon, R., Mizuno, H., Ohki, Y., Sasagene, K., Nagasawa, K., and Hama, Y.: Phys. Rev. B 39, 1337 (1989).CrossRefGoogle Scholar
[8] Tsai, T. E., Griscom, D. L., and Friebele, E. J.: Phys. Rev. Lett. 61, 444 (1988).CrossRefGoogle Scholar
[9] Nelson, C. M. and Weeks, R. A.: J. Am. Ceram. Soc. 43, 396 (1960); 43, 399 (1960)CrossRefGoogle Scholar
[10] Yip, K. L. and Fouler, W. B.: Phys. Rev. B 11, 2327 (1975).CrossRefGoogle Scholar