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Orthorhombic Splitting and Chemical Etching of Ba2Ycu3O7-δ Crystal Surfaces

Published online by Cambridge University Press:  28 February 2011

D. J. Werder ,
C. H. Chen ,
M. Gurvitch ,
B. Miller ,
L. F. Schneemeyer  and
J. V. Waszczak
D. J. Werder
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
C. H. Chen
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
M. Gurvitch
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
B. Miller
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
L. F. Schneemeyer
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
J. V. Waszczak
Affiliation:
AT&T Bell Laboratories, Murray Hill, New Jersey 07974
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Abstract

We find by transmission electron diffraction (TED) that the orthorhombic splitting of the upper surface layers (< 1 μm) of single crystal Ba2YCu3O7-δ(YBCO) is reduced, differing by 10 to 30 percent from the bulk value. We also find by transmission electron microscopy (TEM) that in general the surfaces are of inferior quality, and thus, not representative of the bulk. These results have important consequences for those experiments that probe only the upper surface layers. By etching with either Br/ethanol or HClO4/NaClO4 the poor quality surfaces can be removed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 169: Symposium M – High Temperature Superconductors: Fundamental Properties and Novel Materials Processing , 1989 , 797
Copyright
Copyright © Materials Research Society 1990

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References

1 Werder, D. J., Chen, C. H., Gurvitch, M., Miller, B., Schneemeyer, L. F. and Waszczak, J. V., Physica C 160, 411 (1989).Google Scholar
2 Schneemeyer, L. F., Waszczak, J. V., Siegrist, T., van Dover, R. B., Rupp, L. W., Batlogg, B., Cava, R. J., and Murphy, D. W., Nature 328, 601 (1987).Google Scholar
3 Rothman, S. J., Routhbort, J. L. and Baker, J. E. Phys. Rev. 40, 8852, (1989).Google Scholar
4 Stoffel, N. G., Bonner, W. A., Morris, P. A., and Wilkens, B. J., Mat. Res. Soc. Symp. Proc. 99, 507 (1988).Google Scholar
5 Gurvitch, M., Valles, J. M., Dynes, R. C., Cucolo, A. M., and Schneemeyer, L. F., Phys. Rev. Lett. 63, 1008 (1989).Google Scholar