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Performance of Ultrahigh Resolution Electron Microscope JEM-4000EX and some Applications of High Tc Superconductor

Published online by Cambridge University Press:  21 February 2011

Toshikazu Honda ,
Katsuhiko Ibe ,
Yukihisa Ishida  and
Michael M. Kersker
Toshikazu Honda
Affiliation:
JEOL LTD., 1-2 Musashino 3-chome, Akishima, Tokyo 196, Japan
Katsuhiko Ibe
Affiliation:
JEOL LTD., 1-2 Musashino 3-chome, Akishima, Tokyo 196, Japan
Yukihisa Ishida
Affiliation:
JEOL LTD., 1-2 Musashino 3-chome, Akishima, Tokyo 196, Japan
Michael M. Kersker
Affiliation:
JEOL (U.S.A.) Inc., 11 Dearborn Road, Peabody, MA 01960, U.S.A.
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Abstract

The high resolution electron microscope is powerful for modern materials science, because of its direct observation capability for the atomic structure of materials. The JEM-4000EX, a 400 kV accelerating voltage electron microscope whose objective lens has a 1 mm spherical aberration coefficient, has a 0.168 nm theoretical resolving power. Using this microscope, atomic structure images of high Tc superconductor such as Y-Ba-Cu-O, Bi-Ca-Sr-Cu-O and Tl -Ca-Ba-Cu-O were observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989 , 241
Copyright
Copyright © Materials Research Society 1989

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References

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