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Picosecond Transient Reflectance Measurements of Crystallization In Pure Metals

Published online by Cambridge University Press:  26 February 2011

C.A. MacDonald ,
A.M. Malvezzi  and
F. Spaepen
C.A. MacDonald
Affiliation:
Division of Applied Sciences, Harvard University, Cambridge, MA 02138
A.M. Malvezzi
Affiliation:
Division of Applied Sciences, Harvard University, Cambridge, MA 02138
F. Spaepen
Affiliation:
Division of Applied Sciences, Harvard University, Cambridge, MA 02138
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Abstract

The kinetics of rapid crystallization in metals is investigated by measuring transient optical property changes in laser irradiated gold and copper films in the picosecond and nanosecond regimes. Melt thresholds are determined by examining concentration profiles of multi-layered films before and after irradiation.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 51: Symposium A – Beam-Solid Interactions and Phase Transformations , 1985 , 277
Copyright
Copyright © Materials Research Society 1985

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References

REFERENCES

1.See for example: Fan, J.C. and Johnson, N.M., eds., Energy Beam-Solid Interactions and Transient Thermal Processing, North Holland, NY 1984.Google Scholar
2. Turnbull, D., in Physical Processes in Laser-Materials Interactions, NATO-ASI 1980 Pianore, Italy, Plenum Press 1983.Google Scholar
3. Coriell, S.R. and Turnbull, D., Acta Metall., 30, p2135 (1982).Google Scholar
4. Turnbull, D., J. de Physique C4, p1.Google Scholar
5. Walker, J.L., pp114–5, in Chalmers, B., Principles of Solidification, Wiley, NY 1964.Google Scholar
6. Bennett, M.R. and Wright, J.B., Phys. Stat. Sol. A., 13, p135 (1972).CrossRefGoogle Scholar
7. Buckel, W., Z. Physik, 138, p.136 (1954).CrossRefGoogle Scholar
8. Lin, C.J. and Spaepen, F., in Chemistry and Physics of Rapidly Solidified Materials, Berkowitz, B.J. and Scattergood, R.O., eds., TMS-AIME, 1983.Google Scholar
9. Liu, P.L., et al., Appl. Phy. Lett., 34, p.864 (1979).Google Scholar
10. Thompson, M.O. et al., Phys. Rev. Lett., 50, p.896 (1983).Google Scholar
11. Brown, W.L. in ref.1, p.9.Google Scholar
12. Ujihara, K., J. Appl. Phys. 43, no.5, p2376 (1972).Google Scholar
13. Pudkov, S.D., Zh. Tekh. Fiz 17, p649 (1977).Google Scholar
14. Arnold, G.S., Applied Optics,23, no.9, p1434 (1984).CrossRefGoogle Scholar
15. Dreehsen, H.G., J. Appl. Phys. 56, no.1, p238. (1984)Google Scholar
16. Spaepen, F., Greer, A.L., Kelton, K.F., and Bell, J.L., Rev. Sci Instrum., 56, no.7, p1340 (1985).Google Scholar