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Reliability Assessment of Optical Fibers and Fiber Gratings

Published online by Cambridge University Press:  10 February 2011

Sriraman Kannan
Affiliation:
Specialty Fiber Devices Lucent Technologies, Bell Labs Room I IOD, 25 Schoolhouse Road Somerset, NJ 08873, sri@lucent.com
Paul Lemaire
Affiliation:
Specialty Fiber Devices Lucent Technologies, Bell Labs Room I IOD, 25 Schoolhouse Road Somerset, NJ 08873, sri@lucent.com
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Abstract

The topic of reliability of UV-induced fiber gratings is reviewed. Approaches to assess and predict changes in optical properties of fiber gratings due to thermal decay of refractive index modulation are presented and compared. The mastercurve/demarcation energy diagram approach is shown to be a powerful and general method for the purpose. The process of thermal stabilization to obtain gratings with superior stability is delineated. It is shown that the mastercurve approach could be used to analyze other reliability problems such as in predicting hydrogen-induced losses in fibers.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

1. Hill, K. O., Fujii, Y., Johnson, D. C. and Kawasaki, B. S., Appl. Phys. Lett. 32, p. 647649, (1978).10.1063/1.89881Google Scholar
2. Meltz, G., Morey, W. W. and Glenn, W. H., Opt. Lett. 14, p. 823825, 15 (1989).10.1364/OL.14.000823Google Scholar
3. Vengsarkar, M., Lemaire, P. J., Judkins, J. B., Bhatia, V., Erdogan, T. and Sipe, J. E., J. Light. Tech. 14, p. 5865, 1 (1996).10.1109/50.476137Google Scholar
4. Williams, D. L., Ainslie, B. J., Armitage, J. R., Kashyap, R. and Campbell, R., Electron. Lett. 29, p. 4 5 (1993).Google Scholar
5. Meltz, G. and Morey, W. W., Proc. SPIE 1516, p. 185, (1991).10.1117/12.51164Google Scholar
6. Maxwell, G. D., Ainslie, B. J., Williams, D. L. and Kashyap, R., Electron. Lett. 29, p. 45, (1993).10.1049/el:19930284Google Scholar
7. Bilodeau, F., Malo, B., Albert, J., Johnson, D. C.. Hill, K. O., Hibino, Y., Abe, M. and Kawachi, M., Opt. Lett. 18, p. 953, (1993)10.1364/OL.18.000953Google Scholar
8. Lemaire, P. J., Atkins, R. M., Mizrahi, V. and Reed, W. A., Electron. Lett. 29, p. 1191, (1993).10.1049/el:19930796Google Scholar
9. Kogelnik, H., Bell. Syst. Tech. J. 55, 109 (1976).10.1002/j.1538-7305.1976.tb02062.xGoogle Scholar
10. Yeh, P., Optical Waves in Layered Media, Wiley Interscience, 1988, p. 190.Google Scholar
11. Patrick, H., Gilbert, S. L., Lidgard, A. and Gallagher, M. D., J. Appl. Phys. 78, p. 29402945, 5 (1995).Google Scholar
12. Erdogan, T., Mizrahi, V., Lemaire, P. J. and Monroe, D., J. Appl. Phys. 76, p. 73, (1994).10.1063/1.357062Google Scholar
13. Kannan, S., Guo, J. and Lemaire, P. J., Tech. Dig. OFC'96, 1996, TuO4, pp. 8485.Google Scholar
14. Guo, J., Kannan, S. and Lemaire, P. J., Tech. Dig. OFC′97, 1997, ThJ6, pp. 285287.Google Scholar
15. Williams, D. L. and Smith, R. P., Electron Lett. 31, p. 21202121, 24 (1995).10.1049/el:19951443Google Scholar
16. Borne, Riant, S. and Sansonetti, P., Tech. Dig. OFC′96, 1996, TuO5, pp. 8687.Google Scholar
17. Egan, R. J., Inglis, H. G., Hill, P., Krug, P. A. and Ouellete, F., Tech. Dig. OFC′96, 1996, TuO3, pp. 8384.Google Scholar
18. Kannan, S., Lemaire, P. J., Guo, J. and Luvalle, M. J., Tech. Dig. Of Conference on Bragg Gratings and Photosensitivity Vol.17, 1997, BSuD3, pp. 5254.Google Scholar
19. Kannan, S., Guo, J. and Lemaire, P. J., J. Lightwave. Tech. 15, p. 14781483, 15 (1997).10.1109/50.618380Google Scholar
20. Kannan, S., Copeland, L., Judkins, J.. Luvalle, M. and Lemaire, P. J., Tech. Dig. OFC′98, 1996, ThG6, pp. 282283.Google Scholar
21. OASIXT™ is a commercially available EDFA simulation software program from Specialty Fiber Devices group at Lucent Technologies.Google Scholar
22. Kannan, S., Judkins, J., Wysocki, P. F. and Lemaire, P. J., submitted to Electron. Lett.Google Scholar
23. Bakhti, F., Larrey, J. and Sansonetti, P., Tech. Dig. Of Conference on Bragg Gratings and Photosensitivity Vol.17, 1997, BSuD2, pp. 4951.Google Scholar
24. Anderson, W. T., Johnson, A. J., Kilmer, J. P. and Kanen, R. M., Proc. 37th Int. Wire and Cable Smp., (Reno, 1988), p. 188199.Google Scholar
25. Tomita, and Lemaire, P. J., Electron. Lett. 21, p. 7172, 2 (1985).10.1049/el:19850049Google Scholar
26. Pitt, N.J. and Marshall, A., Electron. Lett. 20, p. 512514, 12 (1984).10.1049/el:19840356Google Scholar
27. Marcerou, J. F., Hervo, J., Artigaud, S., Fevrier, H., Guitton, P. and Landais, S., Proc. ECOC′92, (Berlin, 1992), p. 497500.Google Scholar
28. Lemaire, P. J., Watson, H. A., DiGiovanni, D. J. and Walker, K. L., Photonics Tech. Lett 5, p. 214217, 2 (1993).10.1109/68.196009Google Scholar
29. Lemaire, P. J. in Fiber Optics Reliability and Testing, edited by Paul, D. K., (SPIE Proc. CR50, Boston. MA), p. 8099.Google Scholar
30. Lemaire, P. J., Opt. Eng., 30, p. 780789, 6 (1991).Google Scholar