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Self-Assembled Growth of Highly Oriented Para- Sexiphenyl Thin Films Controlled by Elastic Strain

Published online by Cambridge University Press:  21 March 2011

Andrei Yu. Andreev ,
Helmut Sitter ,
Christoph J. Brabec ,
Peter Hinterdorfer ,
Günter Springholz ,
Niyazi S. Sariciftci ,
Roland Resel  and
Harald Plank
Andrei Yu. Andreev
Affiliation:
Linz Institute for Organic Solar Cells (LIOS), Physical Chemistry, J. Kepler University Linz, Altenbergerstr., 69, A-4040 Linz, Austria
Helmut Sitter
Affiliation:
Institute for Semiconductor - and Solid State Physics, J. Kepler University Linz, Altenbergerstr., 69, A-4040 Linz, Austria
Christoph J. Brabec
Affiliation:
Linz Institute for Organic Solar Cells (LIOS), Physical Chemistry, J. Kepler University Linz, Altenbergerstr., 69, A-4040 Linz, Austria
Peter Hinterdorfer
Affiliation:
Institute for Biophysics, J. Kepler University Linz, Altenbergerstr., 69, A-4040 Linz, Austria
Günter Springholz
Affiliation:
Institute for Semiconductor - and Solid State Physics, J. Kepler University Linz, Altenbergerstr., 69, A-4040 Linz, Austria
Niyazi S. Sariciftci
Affiliation:
Linz Institute for Organic Solar Cells (LIOS), Physical Chemistry, J. Kepler University Linz, Altenbergerstr., 69, A-4040 Linz, Austria
Roland Resel
Affiliation:
Institute of Solid State Physics, Graz University of Technology, A-8010 Graz, Austria
Harald Plank
Affiliation:
Institute of Solid State Physics, Graz University of Technology, A-8010 Graz, Austria
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Abstract

We have studied the structure and growth regularities of highly ordered para-sexiphenyl (C36H26) thin films deposited by Hot Wall Epitaxy on mica. In particular, atomic force microscopy (AFM) was used to investigate the early growth stage of these films, in order to find the process controlling parameters. It was shown that the substrate temperature and the growth time are important parameters for control of the film morphology, in terms of the degree of anisotropy and long range order. X-ray diffraction pole figure technique and transmission electron microscopy were also used to characterize the crystallographic structure of the thicker films. We have shown that the highly ordered crystallites of para-sexiphenyl (showing needle-like morphology by AFM) are oriented with their (11 1 ) or (11 2 ) crystallographic planes parallel to the substrate surface. For each of these two orientations there are two opposite directions for growth of crystallites reflecting the two-fold symmetry of the mica surface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 665: Symposium C – Electronic, Optical and Optoelectronic Polymers and Oligomers , 2001 , C5.24
Copyright
Copyright © Materials Research Society 2001

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References

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