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Spectroscopic Ellipsometry Studies of Giaever Immunology Slide

Published online by Cambridge University Press:  22 February 2011

B. Yang
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
S. Y. Kim
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
K. Vedam
Affiliation:
Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
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Abstract

Spectroscopic ellipsometry has been used to study the dielectric response of indium film evaporated on a glass substrate, as well as that of indium film adsorbed with monolayers of Bovine Serum Albumin (BSA) and Rabbit Antiserum on BSA (RABSA). It is found that the position of the ε2 peak (or the peak of the imaginary part of the complex dielectric function) shifts to longer wavelengths and also increases in height as monolayers of BSA and RABSA are successively adsorbed onto it. The observed peak changes are due to the adsorption of BSA and RABSA on the surface of prolate indium clusters, which in effect increases the effective refractive index of voids between indium islands from 1.0 to 1.075 (BSA) and 1.15 (BSA + RABSA).

Type
Research Article
Copyright
Copyright © Materials Research Society 1986

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References

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