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The Structure of Antigen-Antibody Layers Adsorbed on Silica Surfaces: a Scanning Angle Reflectometry Study

Published online by Cambridge University Press:  15 February 2011

E. K. Mann ,
L. Heinrich ,
J. C. Voegel  and
P. Schaaf
E. K. Mann
Affiliation:
Institut Charles Sadron, Centre National de la Recherche Scientifique, 6 rue Boussingault, 67083 Strasbourg Cedex, France, mann@janus. u-strasbg.fr Institut National de la Santé et de la Recherche Médicale, Unité 424, Fédération de Recherche Odontologique, Université Louis Pasteur, 11 rue Humann, 67085 Strasbourg Cedex, France
L. Heinrich
Affiliation:
Institut Charles Sadron, Centre National de la Recherche Scientifique, 6 rue Boussingault, 67083 Strasbourg Cedex, France, mann@janus. u-strasbg.fr
J. C. Voegel
Affiliation:
Institut National de la Santé et de la Recherche Médicale, Unité 424, Fédération de Recherche Odontologique, Université Louis Pasteur, 11 rue Humann, 67085 Strasbourg Cedex, France
P. Schaaf
Affiliation:
Institut Charles Sadron, Centre National de la Recherche Scientifique, 6 rue Boussingault, 67083 Strasbourg Cedex, France, mann@janus. u-strasbg.fr Ecole Européenne de Chimie, Polymères et Matériaux de Strasbourg, 1 rue Blaise Pascal, 67008 Strasbourg Cedex, France, Institut Universitaire de France.
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Abstract

Scanning Angle Reflectometry (SAR) is used to investigate the structure of protein layers deposited sequentially, first the antigen and then the antibody, on a silica surface. The reflectivity curves are analyzed by means of the optical invariants, a general description valid in the thin film limit which permits the determination of three and only three structural parameters for a dielectric layer, independent of any model of the layer. The three parameters can be related to the first two moments of the mass density in the layer, or to an average film thickness and density. In addition, a new invariant is constructed which directly yields information about the distribution of mass in the layer, and thus goes beyond the usual uniform layer model.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 440: Symposia CA – Structure and Evolution of Surfaces , 1996 , 215
Copyright
Copyright © Materials Research Society 1997

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References

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