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A Study of the Oxygen Surface Exchange Coefficient on La0.5Sr0.5CoO3−δ Thin Films

Published online by Cambridge University Press:  10 February 2011

X. Chen ,
S. Wang ,
Y.L. Yang ,
L. Smith ,
N.J. Wu ,
A.J. Jacobson  and
A. Ignatiev
X. Chen
Affiliation:
SVEC and MRSEC, University of Houston, Houston, TX 77204-5507
S. Wang
Affiliation:
Department of Chemistry and MRSEC, University of Houston, Houston, TX 77204-5500
Y.L. Yang
Affiliation:
Department of Chemistry and MRSEC, University of Houston, Houston, TX 77204-5500
L. Smith
Affiliation:
SVEC and MRSEC, University of Houston, Houston, TX 77204-5507
N.J. Wu
Affiliation:
SVEC and MRSEC, University of Houston, Houston, TX 77204-5507
A.J. Jacobson
Affiliation:
Department of Chemistry and MRSEC, University of Houston, Houston, TX 77204-5500
A. Ignatiev
Affiliation:
SVEC and MRSEC, University of Houston, Houston, TX 77204-5507
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Abstract

La0.5Sr0.5CoO3−δ (LSCO) can be used as a cathode material for low temperature solid oxide fuel cell applications. LSCO epitaxial thin films have been deposited on LaAlO3 substrates by pulsed laser deposition (PLD). The transient behavior of the thin film conductivity with the pressure changes was recorded as a function of temperature and partial oxygen pressure. The surface exchange coefficient k of the LSCO thin film was obtained from analysis of the electrical conductivity relaxation data. The measured surface exchange coefficient increases with temperature and with final pressure but is not sensitive to the initial pressure. After prolonged annealing at 900°C, the k value was found to have greatly increased. The mechanism of the dependence of the measured k on pressure is discussed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 606: Symposium NN – Chemical Processing of Dielectrics, Insulators & Electronic Ceramics , 1999 , 275
Copyright
Copyright © Materials Research Society 2000

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References

1 Kilner, J.A, Souza, R.A. de, and Fullarton, I.C., Solid State Ionics, 86–88, 703(1996).Google Scholar
2 Steele, B.C.H., Solid State Ionics, 75, 157 (1995).Google Scholar
3 Gellings, P.J., and Bouwmeester, H.J.M., The CRC Handbook of Solid State Electrochemistry, (CRC Press, Inc., 1997), p. 481.Google Scholar
4 Elshof, J.E. ten, Lankhorst, M.H.R., and Bouwmeester, H.J.M., J. Electrochem. Soc., 144 (3), 1060 (1997).Google Scholar
5 Yasuda, I., and Hikita, T., J. Electrochem. Soc., 141 (5), 1268 (1994).Google Scholar
6 Mizusaki, J., Mima, Y., Yamauchi, S., Fueki, K., and Tagawa, H., J. Solid State Chem., 80, 102 (1989).Google Scholar
7 doorn, R. H. E. van, Ph.D. Thesis, University of Twente, Enschede, The Netherlands (1996).Google Scholar
8 Routbort, J.L., Doshi, R., and Krumpelt, M., Solid State Ionics, 90, 21 (1996).Google Scholar
9 Kawada, T., Masuda, K., Suzuki, J., Kaimai, A., Kawamura, K., Nigara, Y., Mizusaki, J., Yugami, H., Arashi, H., Sakai, N., and Yokokawa, H., Solid State Ionics, 121, 271 (1999).Google Scholar
10 Chen, X., Wang, S., Yang, Y.L., Smith, L., Wu, N.J., Jacobson, A., and Ignatiev, A., to be published.Google Scholar