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Superconductivity of Bi-Sr-Ca-Cu-O Prepared from CuO or Cu2O, and Doped with Ag Ions

Published online by Cambridge University Press:  28 February 2011

Teruo Kato
Affiliation:
Japan Atomic Energy Research Institute, Tokai-mura, Naka-gun, Ibaraki-ken, 319–11, Japan
Yukio Kazumata
Affiliation:
Japan Atomic Energy Research Institute, Tokai-mura, Naka-gun, Ibaraki-ken, 319–11, Japan
Hiroshi Maeta
Affiliation:
Japan Atomic Energy Research Institute, Tokai-mura, Naka-gun, Ibaraki-ken, 319–11, Japan
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Abstract

Superconductivity in Bi compounds is examined in samples prepared from CuO and Cu2O powders, and also in samples doped with Ag. In BiSrCaCuxO (x=2,3,4,5) prepared from CuO powder, Tc decreases with an increase of Cu content, while in samples prepared from Cu2O the opposite trend, an increase of Tc with Cu content, is observed. From Ag doping, BiSrCaCu2Oy+Agx (x=0, 1.0, 1.5, 2.0), the volume ratio of high to low Tc phase is found to be a maximum at a Ag content between 1.5 and 2.0. From these experiments, a strong correlation between the high Tc phase and Cu+ valence state is suggested.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

1 Maeda, H., Tanaka, T., Fukutomi, M. and Asano, T., Jpn. J. Appl. Phys. 27, L209 (1988).Google Scholar
2 Kijima, N., Endo, H., Tsuchiya, J., Sumiya, A., Mizuno, M. and Oguri, Y., Jpn. J. Appl. Phys. 27, L821 (1988).Google Scholar
3 Onoda, M., Yamamoto, A., Takayama-Muromachi, E. and Takekawa, S., Jpn. J. Appl. Phys. 27, L833 (1988).Google Scholar
4 Takano, M., Takada, J., Oda, K., Kitaguchi, H., Ikeda, Y., Tomii, Y. and Mazaki, H., Jpn. J. Appl. Phys. 27, L1041 (1988).Google Scholar
5 Narumi, S., Ohtu, H., Iguchi, I., Jpn. J. Appl. Phys. 28, L27 (1989).Google Scholar
6 Wu, M.K., Ashburn, J.R., Torng, C.W., Hor, P.H., Meng, R.L., Gao, L., Huang, Z.J., Wang, Y.Z. and Chu, C.W., Phys. Rev. Lett. 58, 908 (1987).Google Scholar
7 Bednorz, J.G. and Müller, K.A., Z. Phys. B64, 198 (1987).Google Scholar
8 Uchida, S., Takagi, H., Kitazawa, K. and Tanaka, S., Jpn. J. Appl. Phys. 26, L1 (1987), ibid L151 and L 123.Google Scholar
9 Oota, A., Ohba, K., Ishida, A., Kirihigashi, A., Iwasaki, K. and Kuwajima, H., Jpn. J. Appl. Phys. 28, L1171 (1989).Google Scholar
10 Shin, J.S., Enomoto, H., Takauchi, H., Takano, Y., Mori, N. and Ozaki, H., Jpn. J. Appl. Phys. 28, L1365 (1989).Google Scholar