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Switching Kinetics of Pulsed Laser Deposited Epitaxial PZT Films

Published online by Cambridge University Press:  15 February 2011

M. Yamazato
Affiliation:
Department of Electrical and Computer Engineering, Kumamoto University, Kumamoto, 860-8555, JAPAN, yamazato@eecs.kumamoto-u.ac.jp
A. M. Grishin
Affiliation:
Department of Electrical and Computer Engineering, Kumamoto University, Kumamoto, 860-8555, JAPAN Department of Condensed Matter Physics, Royal Institute of Technology, S-100 44, Stockholm, Sweden
Y. Yamagata
Affiliation:
Department of Electrical and Computer Engineering, Kumamoto University, Kumamoto, 860-8555, JAPAN
T. Ikegami
Affiliation:
Department of Electrical and Computer Engineering, Kumamoto University, Kumamoto, 860-8555, JAPAN
K. Ebihara
Affiliation:
Department of Electrical and Computer Engineering, Kumamoto University, Kumamoto, 860-8555, JAPAN
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Abstract

We have fabricated epitaxial PbZr0.52Ti0.48O3 (PZT, 40~1200 nm)/YBa2Cu3O7-x (YBCO, 400 nm) film ferroelectric/superconductor heterostructures on the single-crystal neodymium doped yttrium monoaluminate [YAlO3+1%Nd2O3] and MgO substrates by KrF pulsed laser deposition technique. The dielectric constant of 950 and loss tangent δ of 0.04 have been found to be frequency independent in the range 100 Hz to 100 kHz while electric resistivity ρ (150 kV/cm) is of 6×1011 Ω·cm, remnant polarization and coercive field are 32 μC/cm2 and 43 kV/cm, respectively. Fast ferroelectric switching kinetics with characteristic switching time around 50 ns has been observed. Universal electric field and temperature dependencies of switching time as well as film thickness dependence of coercive electric field have been observed and correspond to ferroelectric needle-like domain switching.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

1. Scott, J. F. and Araujo, C. A., Science 246, 1400 (1989).Google Scholar
2. Taylor, D. J., Larsen, P. K., and Cuppens, R., Appl. Phys. Lett. 64, 1392 (1994).Google Scholar
3. Auciello, O., Ray, M. A., Palmer, D., Duarte, J., McGuire, G. E., and Temple, D., Appl. Phys. Lett. 66, 2183 (1995)Google Scholar
4. Kuratani, Y., Omura, S., Okuyama, M. and Hamakawa, Y., Jpn. J. Appl. Phys. 32, 5471 (1995)Google Scholar
5. Kay, H. F. and Dunn, J. W., Philos. Mag. 7, 2027 (1962)Google Scholar
6. Grishin, A. M., Yamazato, M., Yamagata, Y. and Ebihara, K., Appl. Phys. Lett. 72, 620 (1998)Google Scholar
7. Björmander, C., Sreenivas, K., Duan, M., Grishin, A. M. and Rao, K. V., Appl. Phys. Lett. 66, 2493 (1995).Google Scholar
8. Kolmogorov, A. N., Izvestiya Akademii Nauk SSSR 355 (1937)Google Scholar
9. Ishibashi, Y. and Takagi, Y., J. Phys. Soc. Jpn. 31, 506 (1971)Google Scholar
10. Scott, J. F., Kammerdiner, L., Parris, M., Traynor, S., Ottenbacher, V., Shawabkeh, A. and Oriver, W. F., J. Appl. Phys. 64, 792 (1988)Google Scholar