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Synchrotron Characterization of Texture and Stress Evolution in Ag Films

Published online by Cambridge University Press:  01 February 2011

Aaron Vodnick ,
Michael Lawrence ,
Bethany Little ,
Derek Worden  and
Shefford Baker
Aaron Vodnick
Affiliation:
amv35@cornell.edu, Cornell University, Materials Science and Engineering, 214 Bard Hall, Ithaca, NY, 14853-1501, United States
Michael Lawrence
Affiliation:
mdl45@cornell.edu, Cornell University, Department of Materials Science and Engineering, Ithaca, NY, 14853, United States
Bethany Little
Affiliation:
Bethany.Little@houghton.edu, Houghton College, Department of Physics, Houghton, NY, 14744, United States
Derek Worden
Affiliation:
Derek.Worden@Houghton.edu, Houghton College, Department of Physics, Houghton, NY, 14744, United States
Shefford Baker
Affiliation:
spb14@cornell.edu, Cornell University, Department of Materials Science and Engineering, Ithaca, NY, 14853, United States
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Abstract

Real-time in-situ synchrotron x-ray diffraction measurements were performed at the Cornell High Energy Synchrotron Source to characterize both the texture evolution and stresses within the individual texture components of Ag films during recrystallization. As deposited films had a nearly perfect (111) fiber texture. During isothermal anneals, stress and texture were characterized in real-time as the texture evolved into a strong (001) fiber. An Avrami analysis of the evolving texture fractions yielded very different activation energies for films on different barrier layers, suggesting different governing mechanisms were responsible for secondary grain growth. The strains were used to test a common model for texture prediction that assumes the same strain within each texture component. It was found that secondary (001) grains were able to grow primarily strain free. Selection for this strain energy minimizing orientation occurred during the nucleation process during which texture interactions play an important role. By using these real time measurements, we are able to show that driving forces for texture transformations in metal films may not be as simple previously described.

Keywords

x-ray diffraction (XRD)thin filmthermal stresses
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1027: Symposium D – Materials in Transition–Insights from Synchrotron and Neutron Sources , 2007 , 1027-D01-01
Copyright
Copyright © Materials Research Society 2008

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References

1 Thompson, C. V., Annu. Rev. Mater. Sci. 30, 159 (2000).10.1146/annurev.matsci.30.1.159Google Scholar
2 Sonnweber-Ribic, P., Gruber, P., Dehm, G., and Arzt, E., Acta Mater. 54, 3863 (2006).10.1016/j.actamat.2006.03.057Google Scholar
3 Thompson, C. V. and Carel, R., J Mech Phys Solids 44, 657 (1996).10.1016/0022-5096(96)00022-1Google Scholar
4 Vodnick, A. M., Nowak, D. E., and Baker, S. P., to be submitted (2008).Google Scholar
5 Ozcan, A. S., Ludwig, K. F., Lavoie, C., Cabral, C., Harper, J. M. E., and Bradley, R. M., J. Appl. Phys. 92, 5189 (2002).10.1063/1.1512687Google Scholar
6 Baker, S. P., Kretschmann, A., and Arzt, E., Acta Mater. 49, 2145 (2001).10.1016/S1359-6454(01)00127-6Google Scholar
7 Zielinski, E. M., Vinci, R. P., and Bravman, J. C., Appl. Phys. Lett. 67, 1078 (1995).10.1063/1.114455Google Scholar
8 Nowak, D. E. et al. , Rev. Sci. Instrum. 77, 113301 (2006).10.1063/1.2372730Google Scholar
9 Vinci, R. P., Zielinski, E. M., and Bravman, J. C., Thin Solid Films 262, 142 (1995).10.1016/0040-6090(95)05834-6Google Scholar
10 Porter, D. A. and Easterling, K. E., Phase Transformations in Metals and Alloys (Chapman & Hall, 1992).10.1007/978-1-4899-3051-4Google Scholar