Hostname: page-component-76fb5796d-qxdb6 Total loading time: 0 Render date: 2024-04-26T20:47:59.795Z Has data issue: false hasContentIssue false
  • English
  • Français

Thermal Stability of Defects in Substrates for Multiferroic Materials

Published online by Cambridge University Press:  26 February 2011

Shehnaz Jeddy ,
Mary Ellen Zvanut ,
Brian Einstein Lassiter ,
Gregg M Janowski  and
Leonard J Brillson
Shehnaz Jeddy
Affiliation:
sjeddy@uab.edu, university of alabama at birmingham, physics, birmingham, AL, 35294, United States
Mary Ellen Zvanut
Affiliation:
mezvanut@uab.edu, University of Alabama at Birmingham, Physics, Birmingham, AL, 35294, United States
Brian Einstein Lassiter
Affiliation:
lassiterbrian@yahoo.com, University of Idaho, Materials Science and Engineering, Moscow, ID, 83844, United States
Gregg M Janowski
Affiliation:
janowski@uab.edu, University of Alabama at Birmingham, Materials Science and Engineering, Birmingham, AL, 35294, United States
Leonard J Brillson
Affiliation:
brillson.1@osu.edu, Ohio State University, Department of Physics and Center for Materials Research, Columbus, OH, 43210, United States
Get access

Abstract

Strontium Titanate (STO) substrates were studied by electron paramagnetic resonance (EPR) spectroscopy to assess possible changes incurred by deposition of multiferroic thin films. To this effect, STO was vacuum annealed at pressures of 10−5 Torr for one hour at temperatures in the range of 200 – 500 °C. EPR spectra, measured before and after each anneal, revealed changes in the amount of three different defects, Cr3+, Fe3+ and an iron-oxygen vacancy complex, Fe3+Vo. The latter was used to monitor the diffusion of oxygen. EPR analysis showed that Fe3+Vo increases from its as-grown value, suggesting that a charged oxygen species is mobile in the substrate under film deposition conditions. Coupled with a subsequent O2 anneal showing minimal change in the Fe3+Vo signal, the data indicate a loss of oxygen from the sample during vacuum annealing. As charged oxygen vacancies may affect the substrate as well as the substrate/ thin film interface, these results are important for understanding the behavior of multiferroic devices built on STO substrates.

Keywords

thin filmelectron spin resonancedefects
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 966: Symposium T – Ferroelectrics and Multiferroics , 2006 , 0966-T05-04
Copyright
Copyright © Materials Research Society 2007

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Wang, J., Neaton, J. B., Zheng, H., Nagarajan, V., Ogale, S. B., Liu, B., Viehland, D, Vaithyanathan, V., Schlom, D. G., Waghmare, U. V., Spaldin, N. A., Rabe, K. M., Wuttig, M. and Ramesh, R., “Epitaxial BiFeO3 Multiferroic Thin Film Heterostructures”, Science 299, 1719 (2003).Google Scholar
2. Kirkpatrick, S., Muller, K. A. and Rubins, R. S., “Strong Axial Electron Paramagnetic Resonance Spectrum of Fe3+ in SrTiO3 Due to Nearest-Neighbor Charge Compensation”, Phys.Rev. 135, A86 (1964).Google Scholar
3. Schirmer, O.F., Berlinger, W. and Muller, K.A., “Electron Spin Resonance and Optical Identification of Fe4+-Vo in SrTiO3”, Solid State Communication 16, 1289,(1975).Google Scholar
4. Merkle, Rotraut and Maier, Joachim, “Defect association in acceptor-doped SrTiO3: case study for Fe’ TiV.. o and Mn” TiV..”, Phys. Chem. Chem. Phys. 5, 2297, (2003).Google Scholar
5. Muller, K. A., “Paramagnetic Resonance and Optical Absorption of Transition Element Ions in SrTiO3 and LaAlO3”, Proceedings of the First International Conference on Paramagnetic Resonance, (Academic Press, Inc, NY, 1963).Google Scholar