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Transmission Electron Microscopy Studies of Silicon Nitride / Silicon Carbide Interfaces

Published online by Cambridge University Press:  21 February 2011

H. J. Kleebe ,
N. Corbin ,
C. Willkens  and
M. Rühle
H. J. Kleebe
Affiliation:
UCSB, Materials Dept., Eng. III, Santa Barbara, CA
N. Corbin
Affiliation:
Norton Co., Northboro, MA.
C. Willkens
Affiliation:
Norton Co., Northboro, MA.
M. Rühle
Affiliation:
UCSB, Materials Dept., Eng. III, Santa Barbara, CA Now at MPI für Metallforschung, Stuttgart, FRG
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Abstract

Microstructural investigations of HIP'ed silicon nitride reinforced with silicon carbide whiskers were performed using a 400 kV high resolution analytical transmission electron microscope. Two different whisker sources as well as uncoated and carbon coated whiskers were evaluated for their effectiveness in improving mechanical properties.

This paper focuses on microstructural and microchemical analysis of interface and grain boundary regions within the composites. Combined HREM and AEM investigations reveal that variations in fracture toughness are mainly influenced by the microstructural and chemical development of the interface. Fracture toughness can be related to the surface chemistry of the reinforcements.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 170: Symposium N – Interfaces in Composites , 1989 , 79
Copyright
Copyright © Materials Research Society 1990

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