No CrossRef data available.
Article contents
XPS Study of the Interface of Polyimide on Cr And Ni.
Published online by Cambridge University Press: 21 February 2011
Abstract
The paper presents a study of three polyimide-oxide interfaces. The Cr-oxide-PI interface seems to undergo a drastic topographical structural rearrangement. The case of the Ni surface is indicative of heavy decomposition of the Ni oxide which induces the decomposition of the polymer film. On the contrary the stabilized Ni surface behaves in a normal manner indicating that the driving force for the decomposition is the instability of the oxide.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 1989
References
1) “Polyimides:synthesis, characterization and applications”, Mittal, K.L. Ed.,Plenum Press,N.Y.
1984.Google Scholar
2)
Grunze, M.,Unertl, W.N.,Gnanarajan, S. and French, S., in “Electronic Packaging Material Science III”; Jaccodine, R.,Jackson, K.A., Sundhal, R.C. Eds.;MRS,Pittsburgh
1988, p.189.Google Scholar
8)
Narechania, R.G.,Bruce, J.A. and Fridmann, S.A., J.Electrochem. Soc., 132(1985)2700.Google Scholar
12)
Cochran, S.J. and Larkins, F.P., J.Chem.Soc.Faraday Trans.I, 81(1985)2179 and references therein.Google Scholar
14)
Buchwalter, P.L. and Baise, A.I., in Polyimides, Synthesis, characterization and applications, ed.by Mittal, K.L.(Plenum, New York, 1984)Vol.1,p.537.Google Scholar