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Electric field influence on emission of characteristic X-ray from Al2O3 targets bombarded by slow Xe+ ions

Published online by Cambridge University Press:  01 March 2012

J. C. Rao ,
M. Song ,
K. Mitsuishi ,
M. Takeguchi  and
K. Furuya
J. C. Rao*
Affiliation:
Department of Materials Science, Harbin Institute of Technology, Harbin 150001, China
M. Song
Affiliation:
High Voltage Electron Microscopy Station, National Institute for Materials Science, 3-13, Sakura, Tsukuba, Ibaraki 305-0003, Japan
K. Mitsuishi
Affiliation:
High Voltage Electron Microscopy Station, National Institute for Materials Science, 3-13, Sakura, Tsukuba, Ibaraki 305-0003, Japan
M. Takeguchi
Affiliation:
High Voltage Electron Microscopy Station, National Institute for Materials Science, 3-13, Sakura, Tsukuba, Ibaraki 305-0003, Japan
K. Furuya
Affiliation:
High Voltage Electron Microscopy Station, National Institute for Materials Science, 3-13, Sakura, Tsukuba, Ibaraki 305-0003, Japan
*
a)Electronic mail: jcrao@hit.edu.cn
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Abstract

Low energy characteristic X-ray emission from Al2O3 monocrystalline specimens is measured under bombardment of 100 keV Xe+ ions. The electric field influence on emission of the X-rays of constitute elements in the specimens was investigated. The energy dispersive X-ray spectroscopy spectra show that the characteristic X-ray of Al-Kα seems to be depressed by the applied dc voltages, while the peak intensity of O-Kα was not notably influenced. The O-Kα peaks were broadened and the total counts increased as a higher dc bias was applied. It is possible that a dc electric field parallel to the target surface may influence the X-ray emission from it under ion bombardment.

Type
X-Ray Fluorescence and Related Techniques
Information
Powder Diffraction , Volume 21 , Issue 2 , June 2006 , pp. 156 - 157
Copyright
Copyright © Cambridge University Press 2006

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