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Geiger Counter Spectrometer for Industrial Research

  • H. Friedman (a1)

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X-ray diffraction has many applications in the chemical and metallurgical industries, but its techniques have been confined until recently to the laboratory and to highly trained personnel. Conventional procedure entails photographic exposure, processing, and density comparisons of the finished film strips.

The Geiger counter spectrometer described below measures x-ray intensities and diffraction angles directly, without intermediate photographic steps. It is simple enough for unskilled operators performing routine industrial processes yet also meets the precise requirements of laboratory research. The instrument was developed at the Naval Research Laboratory, where it has been in regular use for the past two years.

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(1) Ulrey, C.T., Phys. Rev. 11, p. 401, 1918.
(2) Barrett, C.S., “Structure of Metals.” McGraw-Hill Book Co., New York, 1943.
(3) LeGalley, D.P., R.S.I. 6, p. 279, 1935.
(4) Bragg, W.H., and Bragg, W.L., Proc. Roy. Soc. A 88, p. 428, 1913.
(5) Bragg, W.H., Proc. Phys. Soc. 33, p. 222, 1921.
(6) Brentano, J.C.M., Proc. Phys. Soc., 37, p. 184, 1925; 47, p. 932, 1935; 49, p. 61, 1937.
(7) Locher, G.L., Phys. Rev. 50, p. 1099, 1936.
(8) Sullivan, H.M., R.S.I. 11, p. 356, 1940.
(9) Eisenstein, A., and Gingrich, N.S., R.S.I. 12, p. 582, 1941.
(10) Shaw, C.H., Phys. Rev. 57, p. 877 (1940)
Beeman, W.W. and Friedman, H., Phys. Rev. 56, p. 392 (1939).
(11) Lifschutz, H., R.S.I. 10, p. 21, 1939.
(12) Davey, W.P., General Electric Review 25, p. 565, 1922.

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Geiger Counter Spectrometer for Industrial Research

  • H. Friedman (a1)

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