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X-ray characterization of the new nasicon compositions Na3Zr2−x/4Si2−xP1+xO12 with x=0.333, 0.667, 1.000, 1.333, 1.667

Published online by Cambridge University Press:  10 January 2013

M. Lucco-Borlera ,
D. Mazza ,
L. Montanaro ,
A. Negro  and
S. Ronchetti
M. Lucco-Borlera
Affiliation:
Dipartimento di Scienza dei Materiali e Ingegneria Chimica—Politecnico di Torino
D. Mazza
Affiliation:
Dipartimento di Scienza dei Materiali e Ingegneria Chimica—Politecnico di Torino
L. Montanaro
Affiliation:
Dipartimento di Scienza dei Materiali e Ingegneria Chimica—Politecnico di Torino
A. Negro
Affiliation:
Dipartimento di Scienza dei Materiali e Ingegneria Chimica—Politecnico di Torino
S. Ronchetti
Affiliation:
Dipartimento di Scienza dei Materiali e Ingegneria Chimica—Politecnico di Torino
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Abstract

It is known that solids with composition Na3Zr2Si2PO12 heated at 1200 °C crystallize in the nasicon structure. This material shows a high ionic conductivity that represents an interesting improvement in the field of solid electrolytes. Our experimental results allow to establish for the first time that nasicon structures are stable along the compositional join Na3Zr2−x/4Si2−xP1+xO12 with x extending from 0 to 1.667. These structures are characterized by a Zr underoccupation of octahedral sites and a constant number of Na+ ions. This fact envisages a possible application of these materials in the field of ceramic sensors and ionic conductors.

Type
Research Article
Information
Powder Diffraction , Volume 12 , Issue 3 , September 1997 , pp. 171 - 174
Copyright
Copyright © Cambridge University Press 1997

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