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Can a System be Defined for the New Edition of the Yale Parallax Catalogue?

Published online by Cambridge University Press:  04 August 2017

William van Altena
William van Altena*
Affiliation:
Yale University Observatory P.O. Box 6666 New Haven, CT 06511

Abstract

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A preliminary analysis has been made of data in the forthcoming edition of the Yale Parallax Catalogue to study the possibility of defining a system of observatory zero-points and external accuracies. Based on this analysis and those of several other authors, I conclude that it is not likely that a unique system of zero-points can be established. It may, however, be possible to establish some values for the average external accuracy of the parallaxes, but more work remains to be done on both of these issues. These conclusions are in agreement with those reached by several other authors.

Type
III. Photographic Astrometry
Information
Symposium - International Astronomical Union , Volume 109: Astrometric Techniques , 1986 , pp. 183 - 190
Copyright
Copyright © Reidel 1986 

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