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Absorption and dispersion studies of thermally evaporated nanocrytallite structure ZnIn2Se4 thin films

Published online by Cambridge University Press:  06 February 2009

H. M. Zeyada ,
M. S. Aziz  and
A. S. Behairy
H. M. Zeyada*
Affiliation:
Department of Physics, Faculty of science at Damietta, New Damietta 34517, Egypt
M. S. Aziz
Affiliation:
Department of Physics, Faculty of science at Damietta, New Damietta 34517, Egypt
A. S. Behairy
Affiliation:
Department of Physics, Faculty of science at Damietta, New Damietta 34517, Egypt
*
hzeyada@gmail.com
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Abstract

ZnIn2Se4 has a polycrystalline structure in as synthesized condition. It transforms to nanostructure grains of ZnIn2Se4 upon thermal deposition as thin films. The optical properties of as deposited ZnIn2Se4 films are studied using spectrophotometer measurements of transmittance and reflectance at normal incidence of light in wavelength range (450–2500) nm. The refractive index and absorption index are calculated and it is found that they are independent of film thickness in the thickness range (500–790) nm. Absorption analysis showed two types of electronic transitions; indirect allowed transition with energy gap 1.76 eV accompanied by phonon of energy 25 meV and direct allowed transition with energy gap 2.3 eV. The dispersion analysis showed that the oscillator energy, dispersion energy, dielectric constant at infinite frequency and lattice dielectric constant are 2.49 eV, 14.36 eV, 6.84 and 8.17, respectively.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 45 , Issue 3 , March 2009 , 30601
Copyright
© EDP Sciences, 2009

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References

Fritsche, H.J., Non-Cryst. Sol. 6, 49 (1971) CrossRef
Shionoya, S., Tamato, Y., J. Phys. Soc. Jpn 19, 1142 (1971) CrossRef
Filipowicz, J., Romeo, N., Tarricone, L., Solid State Commun. 38, 619 (1971) CrossRef
Soliman, H.S., El-Nahass, M.M., Qusto, A., J. Mat. Sci. 26, 1556 (1991) CrossRef
Hendia, T.A., Soliman, L.I., Thin Solid Films 261, 322 (1995) CrossRef
Soliman, L.I., Hendia, T.A., Radiat. Phys. Chem. 50, 175 (1997) CrossRef
Bosacchi, A., Bosacch, B., Franchi, S., Hernandez, L., Solid State Commun. 23, 1805 (1973) CrossRef
L.I. Berger, V.D. Prochukhan, Ternary diamond like semiconductor (Consultants Bureau, New York, London, 1969), p. 85
Beun, J.A., Nitsche, R., Lichtensteiger, M., Physica 27, 448 (1961) CrossRef
Abdullayev, A.G., Kermova, T.G., Kyazumov, M.G., Khidrov, A.S., Thin Solid Films 190, 309 (1990) CrossRef
Radautsan, S.I., Georgobiani, A.N., Tigingyanu, I.M., Progr. Cryst. Growth Charact. 10, 403 (1985) CrossRef
S. Tolansky, in Multiple-Beam Interference Microscopy of Metals (Academic, London, 1970), p. 55
El-Nahass, M.M., J. Mater Sci. 27, 6597 (1992) CrossRef
Bakry, A.M., El-Naggar, A.H., Thin Solid Films 360, 293 (2000) CrossRef
Murmann, H., Z. Phys. 101, 643 (1936) CrossRef
Denton, R.E., Campbell, R.D., Tomlin, S.G., J. Phys. D: Appl. Phys. 5, 852 (1972) CrossRef
Bennett, J.M., Booty, M.G., Appl. Opt. 5, 40 (1966)
Tomlin, S.G., J. Phys. D.: Appl. Phys. 1, 1667 (1968) CrossRef
Soliman, H.S., El-Kadry, N., Gamjoum, O., El-Nahass, M.M., Darwish, H.B., J. Opt. 17, 46 (1998)
Konstantinov, I., Babeva, T., Kitova, S., Appl. Opt. 37, 4260 (1998) CrossRef
J. Bardeen, F.J. Slatt, L. Hall, Photoconductivity Conference (Wiley, New York, 1965), p. 146
Kumar, G.A., Thomas, J., George, N., Kumar, B.A., Shnan, P.R., Npoori, V.P., Vallabhan, C.P.G., Unnikrishnan, N.V., Phys. Chem. Glasses 41, 31 (2001)
Di Domenico, M., Wemple, S.H., J. Appl. Phys. 40, 720 (1969) CrossRef
Wemple, S.H., Di Domenico, M., Phys. Rev. B 3, 1338 (1971) CrossRef
El-Nahass, M.M., Farag, A.A.M., Ibrahim, E.M., Abd-El-Rahman, S., Vacuum 72, 453 (2004) CrossRef