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Analog set-up for non linear dielectric measurements up to 100 kHz

Published online by Cambridge University Press:  17 July 2008

J.-M. Leblond
Affiliation:
Institut Universitaire de Technologie, 19 rue L. David, BP 689, 62228 Calais Cedex, France
R. Douali
Affiliation:
LEMCEL, 50 rue F. Buisson, BP 717, 62228 Calais Cedex, France
C. Legrand
Affiliation:
LEMCEL, 50 rue F. Buisson, BP 717, 62228 Calais Cedex, France
P. Ropa
Affiliation:
LEMCEL, 50 rue F. Buisson, BP 717, 62228 Calais Cedex, France
R. Dabrowski
Affiliation:
Military University of Technology, Kaliskiego 2, 00-908 Warszawa, Poland
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Abstract

In this paper, we present a new analog set-up for non linear dielectric measurements. The device is based on the auto-balanced bridge principle used in impedance analyzers. Its main advantage is to operate at high frequencies in comparison with a classical current amplifier. This extension consists in extracting the harmonics of a non sinusoidal current crossing the material. The set-up is used to perform non linear dielectric measurements on a ferroelectric liquid crystal and shows better performances than a previously published digital set-up.

Keywords

Type
Research Article
Copyright
© EDP Sciences, 2008

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